Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Freescale Semiconductor Awards Nano Integrated Solutions, Inc. With the Complete Outsource of its North America Calibration Operations

Abstract:
Nano Integrated Solutions, Inc. (Nano ISI) announced today that it will assume responsibility for North America equipment calibration and repair operations of Freescale Semiconductor.

Freescale Semiconductor Awards Nano Integrated Solutions, Inc. With the Complete Outsource of its North America Calibration Operations

SANTA CLARA, CA | Posted on October 29th, 2007

The five-year agreement between the two firms took effect August 1st of this year and covers operations in Texas, Arizona, Florida, and Illinois including the transfer of metrology technical staff and calibration standards to Nano ISI. Nano ISI will provide Freescale with off-site calibration, on-site in-line calibrations, and equipment repairs on Freescale's equipment pool.

"We went with Nano ISI from among a half-dozen competing metrology firms because it exhibited the best overall service and support offering in the key metrics we look for in calibration support," said Kelly Folts, director of Quality Laboratories for Freescale. "Nano ISI demonstrated the core competencies required by Freescale to give us confidence our metrology requirements would be met."

####

About Nano Integrated Solutions, Inc.
Nano ISI, headquartered in Santa Clara, California, and with metrology labs in Austin, Texas and Tempe, Arizona, is ISO 17025 accredited & DSCC certified providing semiconductor design firms with essential engineering services including full calibration service & support on electronic, dimensional, thermal, mechanical, and environmental equipment. Nano ISI also provides equipment evaluation and repair services.

Nano ISI also provides semiconductor services including full Functional Test Development, Test Consulting (Design For Test — DFT, Design For Manufacturability — DFM, and Yield Enhancement), Test Services, Test Training, Complete Failure Analysis & Debug, FIB Circuit Edit, TEM Analysis, ESD & Latch-up Characterization, Burn-in & Reliability Qualification, PCB Layout Design (Load Boards, Probe Cards, Environmental DUT Hardware, High Performance Boards, etc.).

For more information on Nano Integrated Solutions, Inc. contact Lloyd D. Haugen III at (408) 496-4117 or via email at .

For more information, please click here

Contacts:
Nano Integrated Solutions, Inc.
Lloyd D. Haugen III
408-496-4117

Copyright © Business Wire 2007

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

A*STAR and industry form S$200M semiconductor R&D July 25th, 2014

A Crystal Wedding in the Nanocosmos July 23rd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

Announcements

Stanford team achieves 'holy grail' of battery design: A stable lithium anode - Engineers use carbon nanospheres to protect lithium from the reactive and expansive problems that have restricted its use as an anode July 27th, 2014

Iranian Scientists Produce Reusable Nanoadsorbent to Detect Sulfamide in Chicken July 27th, 2014

Breakthrough laser experiment reveals liquid-like motion of atoms in an ultra-cold cluster: University of Leicester research team unlocks insights into creation of new nano-materials July 25th, 2014

Scientists Test Nanoparticle "Alarm Clock" to Awaken Immune Systems Put to Sleep by Cancer July 25th, 2014

New-Contracts/Sales/Customers

STFC takes delivery of the 100th Hitachi Tabletop SEM in the UK July 3rd, 2014

University of Maastricht Adds Complete Correlative Workflow from FEI to its Institute of Nanoscopy June 23rd, 2014

LatticeGear Sells First LatticeAx 300 Cleaving System to X-FAB: LatticeAx 300 provides fast, accurate cross-sectioning of samples for analysis — more accurately than manual methods and faster and less expensively than automated systems June 9th, 2014

UMass Amherst Purchases Nanonex Advanced 8" NIL Tool NX-2608BA May 28th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE