Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated Circuits

Abstract:
Mentor Graphics Corporation (Nasdaq: MENT) today announced new technology in its TestKompress® automatic test pattern generation (ATPG) product to address the industry's increasing demand for scan test compression. By providing compression levels exceeding 100X, Mentor's new Xpress technology allows integrated circuit (IC) manufacturers to meet their most challenging quality objectives for advanced process nodes at 65 nanometers (nm) and beyond without driving up the cost of testing.

Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated Circuits

WILSONVILLE, OR | Posted on October 1st, 2007

"Achieving high test quality for devices built on advanced processes implies an explosive growth in test pattern size," asserts Osamu Tada, department manager of System Level Design and Verification Technology Dept., Renesas Technology Corp., "We see the high level of compression provided by TestKompress Xpress as a critical advance to enable us to maintain high test coverage at a manageable test cost."

The latest integrated circuit manufacturing process advances have significantly increased the number of gates on an IC, and test pattern sizes continue to grow as a result. In addition, shrinking geometries introduce new defect mechanisms. To maintain the quality of product shipped, manufacturers need to apply an ever-expanding set of scan tests, such as "at-speed" and "small delay" tests, to identify subtle defects, and keep DPM (defects per million) levels down. Adding new types of tests expands the test pattern size many times over, and this trend is expected to accelerate at each process node. Consequently, test pattern compression has become an important requirement for high quality manufacturing test. In fact, the International Technology Roadmap for Semiconductors (ITRS) predicts that by 2008 the industry will need 200X test data volume compression, with the requirement growing exponentially over the next five years. Mentor's TestKompress product, which debuted in 2001 as the first commercial ATPG tool to offer on-chip test compression, is on a technology path to meet these future compression targets with innovations like the new Xpress pattern compaction technology.

The latest version of the TestKompress product increases the achievable level of compression by providing a more efficient way to handle so-called "X-states." Xs are unknown states that can arise during manufacturing test. Xs can result in a loss of test coverage if not handled properly and tend to increase the test pattern size required to test a device thoroughly. The patented Xpress compactor innovation provides a more efficient way to deal with Xs by combining sophisticated embedded test data selection circuitry with an advanced software control algorithm. Because Xpress technology masks the effects of Xs more efficiently, test patterns can be smaller and more highly compressed. More compressed test patterns result in shorter test times, higher production test throughput, lower manufacturing costs, and can extend the life of existing test equipment. Using Xpress technology requires no change to the functional design and is completely transparent to the TestKompress user, so there is no additional learning curve.

"The industry demand for compression has not slowed down since we first introduced compression to the market in 2001. In fact, based on our customers' rapid adoption of ever increasing levels of embedded compression, we believe that the ITRS compression roadmap paints an accurate picture of the industry's need," said Robert Hum, vice president and general manager of the Design Verification and Test Division, Mentor Graphics. "Mentor is committed to advancing compression technology in order to address not only the current needs, but also the future requirements of deep submicron IC testing."

Availability
TestKompress Xpress is available for beta evaluation and will be in production in the fourth quarter release of TestKompress, scheduled to ship in November 2007.

####

About Mentor Graphics Corporation
Mentor Graphics Corporation (Nasdaq: MENT) is a world leader in electronic hardware and software design solutions, providing products, consulting services and award-winning support for the world’s most successful electronics and semiconductor companies. Established in 1981, the company reported revenues over the last 12 months of over $825 million and employs approximately 4,300 people worldwide. Corporate headquarters are located at 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777.

For more information, please click here

Contacts:
Gene Forte
Mentor Graphics
503.685.1193


Sonia Harrison
Mentor Graphics
503.685.1165

Copyright © Mentor Graphics Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Superconducting circuits, simplified: New circuit design could unlock the power of experimental superconducting computer chips October 18th, 2014

3DXNano™ ESD Carbon Nanotube 3D Printing Filament - optimized for demanding 3D printing applications in the semi-con and electronics industry October 16th, 2014

Future computers could be built from magnetic 'tornadoes' October 14th, 2014

Australian teams set new records for silicon quantum computing October 12th, 2014

Announcements

HP Supercomputer at NREL Garners Top Honor October 19th, 2014

First Canada Excellence Research Chair gets $10 million from the federal government for oilsands research at the University of Calgary: Federal government announces prestigious research chair to study improving oil production efficiency October 19th, 2014

Ucore's McKenzie to Deliver Presentation to Rare Earths Conference in Singapore as Highlight of Fall 2014 Marketplace Schedule October 19th, 2014

Non-Toxic Nanocatalysts Open New Window for Significant Decrease in Reaction Process October 19th, 2014

Tools

New Grand ARM Transmission Electron Microscope Offers Highest Commercially-Available Atomic Resolution of 63 Picometers October 17th, 2014

Nanodevices for clinical diagnostic with potential for the international market: The development is based on optical principles and provides precision and allows saving vital time for the patient October 15th, 2014

Nanotronics Imaging Releases nSPEC® 3D, Powerful Microscope That Captures 3D Images at Nanoscale, in Lightning Speed: Company Unveils Design at American Chemical Society 2014 International Elastomer Conference October 14th, 2014

Unique catalysts for hydrogen fuel cells synthesized in ordinary kitchen microwave oven October 14th, 2014

NanoNews-Digest
The latest news from around the world, FREE





  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE