Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > X-Tek announces CT Capability and new features for the Revolution on stand No: 1B25

August 30th, 2007

X-Tek announces CT Capability and new features for the Revolution on stand No: 1B25

Abstract:
X-Tek Group will announce the inclusion of a new camera and detector combination for the Revolution Nanotech X-ray inspection system and a new validation station for enhanced production capability at stand 1B25.

Visitors
are able to see Computerized Tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system.

Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.

Source:
emsnow.com

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

3-D-printed jars in ball-milling experiments June 29th, 2017

X-ray photoelectron spectroscopy under real ambient pressure conditions June 28th, 2017

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

Picosunís ALD solutions enable novel high-speed memories June 27th, 2017

Tools

X-ray photoelectron spectroscopy under real ambient pressure conditions June 28th, 2017

Nanometrics to Participate in the 9th Annual CEO Investor Summit 2017: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco June 27th, 2017

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

New TriboLab CMP Provides Cost-Effective Characterization of Chemical Mechanical Wafer Polishing Processes: Bruker Updates Industry-Standard CP-4 Platform for Most Flexible and Reliable Testing June 27th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project