Home > News > X-Tek announces CT Capability and new features for the Revolution on stand No: 1B25
August 30th, 2007
X-Tek announces CT Capability and new features for the Revolution on stand No: 1B25
X-Tek Group will announce the inclusion of a new camera and detector combination for the Revolution Nanotech X-ray inspection system and a new validation station for enhanced production capability at stand 1B25.
are able to see Computerized Tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system.
Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
Scientific breakthrough in rechargeable batteries: Researchers from Singapore and Québec Team Up to Develop Next-Generation Materials to Power Electronic Devices and Electric Vehicles February 28th, 2015
First detailed microscopy evidence of bacteria at the lower size limit of life: Berkeley Lab research provides comprehensive description of ultra-small bacteria February 28th, 2015
Leti to Offer Updates on Silicon Photonics Successes at OFC in LA February 27th, 2015
Moving molecule writes letters: Caging of molecules allows investigation of equilibrium thermodynamics February 27th, 2015
Hiden CATLAB Microreactor System at ARABLAB 2015 | Visit us on Booth 1011 February 26th, 2015
Renishaw and Bruker team up for a workshop on TERS and co-localised AFM Raman February 26th, 2015
Maximum Precision in 3D Printing: New complete solution makes additive manufacturing standard for microfabrication February 26th, 2015
Real-time observation of bond formation by using femtosecond X-ray liquidography February 26th, 2015