- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
August 30th, 2007
X-Tek Group will announce the inclusion of a new camera and detector combination for the Revolution Nanotech X-ray inspection system and a new validation station for enhanced production capability at stand 1B25.
are able to see Computerized Tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system.
Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
|Related News Press|
Seeing quantum motion August 30th, 2015
Artificial leaf harnesses sunlight for efficient fuel production August 30th, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015
Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015