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SEMTech Solutions opens new FE-SEM services laboratoryNorth Billerica, MA | Posted on July 31st, 2007
The laboratory is equipped with two FE-SEMs. The first FE-SEM will be primarily used for its analytical capabilities that include an Energy Dispersive Spectrometer and a Back Scattered Electron detector, as well as providing Secondary Electron Imaging. The second FE-SEM, a 3-D metrology system from Elionix in Japan, can measure surface height roughness profiles ranging from 1 nm to several hundred microns. The Elionix system is targeted at metallurgical companies where an AFM has trouble measuring large surface roughness height deviations or wide lateral measurement fields.
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