Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI Releases microValidator(TM) Software for SEMs and EDS

Abstract:
New package delivers highly automated and objective validation of imaging and analytical performance for forensics and mining applications

FEI Releases microValidator(TM) Software for SEMs and EDS

HILLSBORO, OR | Posted on July 19th, 2007

FEI (Nasdaq: FEIC) has announced the availability of an all-new software package known as the microValidator(TM). This unique software is designed to deliver rapid validation of FEI's scanning electron microscope (SEM) and X-Ray Microanalysis (EDS) systems used for automated particle and phase search analysis. Such applications are utilized to study gun shot residue (GSR) and for mineral liberation analysis (MLA) in the forensics and mining industries, respectively.

The microValidator aims to provide fast, automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing the accuracy, traceability, and reproducibility of results. Forensic applications require validation to substantiate the evidentiary value of GSR analysis, while the mining industry often bases major investment decisions on MLA results. The package includes software, an integrated beam current meter, and a new sub-stage mount containing essential standards. All standards are certified and each one is serialized, fully characterized and documented.

The standards block of the microValidator can also be fitted with customers' own GSR proficiency test samples that can then be launched automatically to validate performance and check for measurement accuracy. The highly automated procedure enables reproducibility and encourages frequent use.

The microValidator offers three levels of automated testing: SEM, EDS and combined SEM/EDS checks. Upon completion of selected tests the system generates a report showing that all functions are operating correctly or which functions have failed. The program is also designed to differentiate between user-correctable errors and service-related errors. If all selected tests pass, users can show that system performance has been validated objectively.

The microValidator software is compatible with EDAX and Bruker X-ray microanalysis systems. To discover more about the microValidator software, visit http://www.fei.com/forecnsics or http://www.fei.com/mining .

####

About FEI Company
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.

This news release contains forward-looking statements that include statements about introduction of our microValidator software and related hardware and its uses. Factors that could affect these forward-looking statements include but are not limited to failure of the product to perform as expected [or as it performed in beta testing]; unforeseen technical problems; problems in deploying, customizing and manufacturing the software and related hardware; and problems with our suppliers and the analytical tools that are used with the micro Validator system. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Dan Zenka, APR
FEI Company
+1-503-726-2695

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Berkeley Lab Researchers Demonstrate First Size-based Chromatography Technique for the Study of Living Cells April 22nd, 2014

PETA science consortium to present hazard testing strategy at nanotoxicology meeting: High tech field ripe for use of sophisticated non-animal testing strategies April 22nd, 2014

Harris & Harris Group Notes the Receipt of Proceeds From the Sale of Molecular Imprints' Semiconductor Business to Canon April 22nd, 2014

National Space Society Congratulates SpaceX on the Success of CRS-3 and the First Flight of the Falcon 9R April 22nd, 2014

Tools

MRI, on a molecular scale: Researchers develop system that could one day peer into the atomic structure of individual molecules April 20th, 2014

Oxford Instruments Asylum Research Introduces the MFP-3D InfinityTM AFM Featuring Powerful New Capabilities and Stunning High Performance April 18th, 2014

More effective kidney stone treatment, from the macroscopic to the nanoscale April 17th, 2014

Aerotech X-Y ball-screw stage for economical high performance Planar positioning April 16th, 2014

NanoNews-Digest
The latest news from around the world, FREE







  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE