Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI Releases microValidator(TM) Software for SEMs and EDS

Abstract:
New package delivers highly automated and objective validation of imaging and analytical performance for forensics and mining applications

FEI Releases microValidator(TM) Software for SEMs and EDS

HILLSBORO, OR | Posted on July 19th, 2007

FEI (Nasdaq: FEIC) has announced the availability of an all-new software package known as the microValidator(TM). This unique software is designed to deliver rapid validation of FEI's scanning electron microscope (SEM) and X-Ray Microanalysis (EDS) systems used for automated particle and phase search analysis. Such applications are utilized to study gun shot residue (GSR) and for mineral liberation analysis (MLA) in the forensics and mining industries, respectively.

The microValidator aims to provide fast, automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing the accuracy, traceability, and reproducibility of results. Forensic applications require validation to substantiate the evidentiary value of GSR analysis, while the mining industry often bases major investment decisions on MLA results. The package includes software, an integrated beam current meter, and a new sub-stage mount containing essential standards. All standards are certified and each one is serialized, fully characterized and documented.

The standards block of the microValidator can also be fitted with customers' own GSR proficiency test samples that can then be launched automatically to validate performance and check for measurement accuracy. The highly automated procedure enables reproducibility and encourages frequent use.

The microValidator offers three levels of automated testing: SEM, EDS and combined SEM/EDS checks. Upon completion of selected tests the system generates a report showing that all functions are operating correctly or which functions have failed. The program is also designed to differentiate between user-correctable errors and service-related errors. If all selected tests pass, users can show that system performance has been validated objectively.

The microValidator software is compatible with EDAX and Bruker X-ray microanalysis systems. To discover more about the microValidator software, visit http://www.fei.com/forecnsics or http://www.fei.com/mining .

####

About FEI Company
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.

This news release contains forward-looking statements that include statements about introduction of our microValidator software and related hardware and its uses. Factors that could affect these forward-looking statements include but are not limited to failure of the product to perform as expected [or as it performed in beta testing]; unforeseen technical problems; problems in deploying, customizing and manufacturing the software and related hardware; and problems with our suppliers and the analytical tools that are used with the micro Validator system. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Dan Zenka, APR
FEI Company
+1-503-726-2695

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

ASU, IBM move ultrafast, low-cost DNA sequencing technology a step closer to reality November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Tools

Iranian Experts Clean Uranium-Contaminated Water by Nano-Particles November 23rd, 2014

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE