Nanotechnology Now - Press Release: "FEI Releases microValidator(TM) Software for SEMs and EDS"

Home > Press > FEI Releases microValidator(TM) Software for SEMs and EDS

Abstract:
New package delivers highly automated and objective validation of imaging and analytical performance for forensics and mining applications

FEI Releases microValidator(TM) Software for SEMs and EDS

HILLSBORO, OR | Posted on July 19th, 2007

FEI (Nasdaq: FEIC) has announced the availability of an all-new software package known as the microValidator(TM). This unique software is designed to deliver rapid validation of FEI's scanning electron microscope (SEM) and X-Ray Microanalysis (EDS) systems used for automated particle and phase search analysis. Such applications are utilized to study gun shot residue (GSR) and for mineral liberation analysis (MLA) in the forensics and mining industries, respectively.

The microValidator aims to provide fast, automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing the accuracy, traceability, and reproducibility of results. Forensic applications require validation to substantiate the evidentiary value of GSR analysis, while the mining industry often bases major investment decisions on MLA results. The package includes software, an integrated beam current meter, and a new sub-stage mount containing essential standards. All standards are certified and each one is serialized, fully characterized and documented.

The standards block of the microValidator can also be fitted with customers' own GSR proficiency test samples that can then be launched automatically to validate performance and check for measurement accuracy. The highly automated procedure enables reproducibility and encourages frequent use.

The microValidator offers three levels of automated testing: SEM, EDS and combined SEM/EDS checks. Upon completion of selected tests the system generates a report showing that all functions are operating correctly or which functions have failed. The program is also designed to differentiate between user-correctable errors and service-related errors. If all selected tests pass, users can show that system performance has been validated objectively.

The microValidator software is compatible with EDAX and Bruker X-ray microanalysis systems. To discover more about the microValidator software, visit http://www.fei.com/forecnsics or http://www.fei.com/mining .

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About FEI Company
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.

This news release contains forward-looking statements that include statements about introduction of our microValidator software and related hardware and its uses. Factors that could affect these forward-looking statements include but are not limited to failure of the product to perform as expected [or as it performed in beta testing]; unforeseen technical problems; problems in deploying, customizing and manufacturing the software and related hardware; and problems with our suppliers and the analytical tools that are used with the micro Validator system. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

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Contacts:
Dan Zenka, APR
FEI Company
+1-503-726-2695

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