Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > X-Tek Exhibits at Semicon West

July 6th, 2007

X-Tek Exhibits at Semicon West

Abstract:
X-Tek Group, the global manufacturer of real-time microfocus X-ray systems, will be demonstrating Computerized Tomography (CT) at booth H7853, a powerful new 3D imaging capability that X-Tek has now introduced to their established Revolution X-ray system.

CT produces high resolution 3D data sets that can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and substrates.

With over 20 years experience in leading edge X-ray technology, X-Tek has enabled users to benefit from simple to use, cost effective true 3D imaging for fast and reliable internal analysis measurement, reverse engineering and product verification. X-Tek's proprietary technologies incorporate the unique and patented Microfocus Xi X-ray source, Nanotech™ Target assembly and Inspect-X system control and analysis software. The integrated Microfocus Xi source is maintenance free and highly reliable. Free from high voltage cables and with easy to change extended life filament, the high performance Xi source is both mobile and compact.

Source:
pcb007.com

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Iranian Researchers Planning to Produce Edible Insulin January 28th, 2015

Nanoparticles that deliver oligonucleotide drugs into cells described in Nucleic Acid Therapeutics January 28th, 2015

'Bulletproof' battery: Kevlar membrane for safer, thinner lithium rechargeables January 28th, 2015

Spider electro-combs its sticky nano-filaments January 28th, 2015

Tools

Joint international research project leads to a breakthrough in terahertz spectroscopy January 28th, 2015

JPK opens new expanded offices in Berlin to meet the growing demand for products worldwide January 28th, 2015

Pittcon News: Renishaw adds to the comprehensive imaging options available with its inVia confocal Raman microscope January 27th, 2015

Nanometrics to Present at the Stifel 2015 Technology, Internet and Media Conference January 27th, 2015

Events/Classes

Pittcon News: Renishaw adds to the comprehensive imaging options available with its inVia confocal Raman microscope January 27th, 2015

Nanometrics to Present at the Stifel 2015 Technology, Internet and Media Conference January 27th, 2015

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE