- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
July 6th, 2007
X-Tek Group, the global manufacturer of real-time microfocus X-ray systems, will be demonstrating Computerized Tomography (CT) at booth H7853, a powerful new 3D imaging capability that X-Tek has now introduced to their established Revolution X-ray system.
CT produces high resolution 3D data sets that can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and substrates.
With over 20 years experience in leading edge X-ray technology, X-Tek has enabled users to benefit from simple to use, cost effective true 3D imaging for fast and reliable internal analysis measurement, reverse engineering and product verification. X-Tek's proprietary technologies incorporate the unique and patented Microfocus Xi X-ray source, Nanotech™ Target assembly and Inspect-X system control and analysis software. The integrated Microfocus Xi source is maintenance free and highly reliable. Free from high voltage cables and with easy to change extended life filament, the high performance Xi source is both mobile and compact.
|Related News Press|
Leti Announces Launch of First European Nanomedicine Characterisation Laboratory: Project Combines Expertise of 9 Partners in 8 Countries to Foster Nanomedicine Innovation and Facilitate Regulatory Approval July 1st, 2015
Spain nanotechnology featured at NANO KOREA 2015 June 26th, 2015