Nanotechnology Now - News Story: "X-Tek Exhibits at Semicon West"

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July 6th, 2007

Abstract:
X-Tek Group, the global manufacturer of real-time microfocus X-ray systems, will be demonstrating Computerized Tomography (CT) at booth H7853, a powerful new 3D imaging capability that X-Tek has now introduced to their established Revolution X-ray system.

CT produces high resolution 3D data sets that can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and substrates.

With over 20 years experience in leading edge X-ray technology, X-Tek has enabled users to benefit from simple to use, cost effective true 3D imaging for fast and reliable internal analysis measurement, reverse engineering and product verification. X-Tek's proprietary technologies incorporate the unique and patented Microfocus Xi X-ray source, Nanotech™ Target assembly and Inspect-X system control and analysis software. The integrated Microfocus Xi source is maintenance free and highly reliable. Free from high voltage cables and with easy to change extended life filament, the high performance Xi source is both mobile and compact.

Source:
pcb007.com

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