Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > FEI’s new Phenom™ bridges the gap between optical and scanning electron microscopy

Innovative Microscope Makes High-Resolution Imaging Available to a Broader Base of Industrial and Academic Users

FEI’s new Phenom™ bridges the gap between optical and scanning electron microscopy

HILLSBORO, OR | Posted on June 25th, 2007

FEI (NASDAQ: FEIC) has released its new Phenom™ microscope, an innovative system that bridges the critical price and performance gap between optical and scanning electron microscope (SEM) technologies. Operated easily via its highly intuitive and interactive touch screen, the Phenom can be used in almost any location and does not require specialized facilities or highly skilled operators.

Capable of yielding magnification up to 20,000x, or 20 times higher than most advanced optical scopes, the Phenom addresses a wide variety of industrial and academic applications including quality assurance, product development, research and teaching. Because of its simplicity, compact design and comparable price to high-end optical systems, the Phenom is expected to bring high-resolution imaging to a much broader base of users and accelerate scientific discovery and new product development. It has already received several prestigious accolades including the Red Dot Design award in Germany, a 2006 Mechatronica Design Award in the Netherlands, and a Recognition of Excellence in Innovation from the U.S. Department of Commerce.
"The Phenom represents a technology jump similar to that of moving from CDs to MP3s. This is FEI's iPod™--it's beautiful to look at and has a simple, intuitive interface. Its ease of use makes it extremely inviting, even to those who have never before operated a microscope," said Dr. Steven Berger, vice president of the Phenom development group for FEI. "This new microscope makes high-resolution electron microscopy imaging practical and affordable, providing cost effective solutions for a wide range of imaging challenges that can no longer be solved with optical technologies."

Beyond picking up where optical microscopes are losing resolution power, the Phenom's potential market will also include organizations that need SEM technology but cannot afford the typical investment of more than US $200,000 for a traditional SEM system plus the costs of additional personnel, and facilities.

The Phenom is also the ideal tool for educating the next generation of nano-focused researchers and scientists. At approximately one-third the price of a traditional SEM, the Phenom will be affordable for many more undergraduate and community college programs, mainstreaming access to the nanoscale. Its ease of use and portability between classrooms will make teaching more exciting and inspire students to learn more about the science and theory behind the images. The Phenom can even play an important role in middle and high school science programs of the future.

The Phenom is now available for purchase in Europe and North America. Sales to the rest of the world will be rolled out in 2008.

The Phenom also represents a new low-cost platform for future products from FEI.
As part of the Phenom launch, FEI is holding a series of introductory events in San Francisco, Boston and New York. Discover more about the Phenom at .


About FEI Company
FEI (NASDAQ: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI’s Tools for Nanotech™ are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at .

The Phenom was funded in part by a federal grant provided to ONAMI (Department of Energy Solar Energy Program under Award Number DE-FG36-06GO86073 and the Department of Energy Biological and Environmental Research under Award Number DE-FG02-06ER64248) and a European Union stimulus grant to FEI.

This news release contains forward-looking statements that include statements about introduction of our new Phenom product and future markets, uses and applications. Factors that could affect these forward-looking statements include but are not delays in releasing the product, failure of the product to perform as expected; failure of the product to penetrate markets described; failure of customers to adopt the applications described; delay or cancellation of additional development work to move the product from beta to release; technical problems arising during the beta phase; and problems with our suppliers. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Dan Zenka, APR
FEI Company
+1 503 726 2695

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press


ICN2 researchers compute unprecedented values for spin lifetime anisotropy in graphene November 17th, 2017

Math gets real in strong, lightweight structures: Rice University researchers use 3-D printers to turn century-old theory into complex schwarzites November 16th, 2017

The stacked color sensor: True colors meet minimization November 16th, 2017

Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017


Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017

Nanometrics Announces $50 Million Share Repurchase Program November 15th, 2017

Nanometrics Board of Directors Names Pierre-Yves Lesaicherre President and CEO November 14th, 2017

Oxford Instruments announces winner of the 2017 Sir Martin Wood Prize for Japan November 14th, 2017

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
University Technology Transfer & Patents
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project