- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
Secure Remote Program Speeds Repair Times and Enhances Tool Availability
FEI's (Nasdaq: FEIC) customer service organization has introduced RAPID (Remote Access Program for Interactive Diagnostics), an all-new service offering that can significantly speed service times and maximize system uptime. The RAPID program is first being made available to FEI customers in North America and will soon be extended worldwide.
With RAPID remote diagnostics FEI service engineers will now be able to run service test software and diagnostics on systems that are equipped for RAPID whenever a customer initiates a service call and the remote diagnostics protocol. With the program, tool settings can be checked and modified, and software can be patched and upgraded as needed. FEI engineers can also view images from the microscope and make performance assessments.
The remote diagnostics program, the first of its kind in the microscopy industry, will be able to solve many system problems remotely, eliminating the need for an on-site service call. If it is determined that replacement parts are needed, field engineers will be able to order them in advance of their service visit thus shortening the overall time to repair.
"We believe that with RAPID remote diagnostics, FEI will be able to give its customers significantly improved service levels and reduced time to repair leading to improved tool availability," outlined Paul O'Mara, vice president of worldwide service for FEI. "During the beta period nearly 50 percent of service calls were resolved remotely. This provides a significant benefit to customers not available from other vendors, and it's included at no charge with their existing service or warranty contract."
The majority of systems within FEI's Titan™, Tecnai™, Nova™, Strata™, Quanta™, Helios™ and Inspect™ families of microscopes are RAPID compatible. Many older products may also be supported - either "as is," with a system upgrade or with the addition of a support PC. Existing customers with service agreements can obtain RAPID software from their field service engineer, who can assist with its installation if needed. Once installed, users can call the FEI call center to request an on-line test of system connectivity.
The RAPID remote diagnostics' connection is highly secure and can only be initiated from the customer's location. A secure portal located outside of FEI's main corporate network maintains a minimum number of outside ports and manages all connections between customer instruments and FEI remote service engineers. Customer systems are fully isolated from each other and communicate with the secure portal using an encrypted virtual private network (VPN) connection.
For more information on RAPID remote diagnostics customers can contact their field engineers or visit http://www.fei.com/rapid .
About FEI Company
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI’s Tools for Nanotech™ are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at http://www.fei.com .
This news release contains forward-looking statements about a new remote diagnostic service offering and its capabilities and possible benefits. Factors that could affect these forward-looking statements include but are not limited to delays in the roll-out of the product, failure of general release to replicate beta results for the product or failure of the product to perform as expected due to technical or other reasons. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.
For more information, please click here
Dan Zenka, APR
Global Public Relations
+1 503 726 2695
Copyright © FEI CompanyIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Using DNA origami to build nanodevices of the future September 1st, 2015
Nanotech could rid cattle of ticks, with less collateral damage September 1st, 2015
Scientists 'squeeze' light one particle at a time: A team of scientists have measured a bizarre effect in quantum physics, in which individual particles of light are said to have been 'squeezed' -- an achievement which at least one textbook had written off as hopeless September 1st, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015
Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015