Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Park Systems New XE-70 AFM/SPM with Decoupled XY and Z Scanners Eliminates Artifacts from Cross-Talk in Images

Abstract:
Research-grade XE-70 Atomic Force/Scanning Probe Microscope with Flexible Sample Handling Overcomes Limitations of Tube Scanners, Produces Accurate Images.

Park Systems New XE-70 AFM/SPM with Decoupled XY and Z Scanners Eliminates Artifacts from Cross-Talk in Images

SANTA CLARA, CA | Posted on May 23rd, 2007

Park Systems Corp. (www.parkafm.com), a global provider of nanoscale measurement systems for research and industry, will demonstrate its new XE-70 Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM). The XE-70 is designed to be used in laboratories to measure samples up to 100 mm in XY and 20 mm in Z. Park Systems will demonstrate the XE-70 AFM/SPM in Booth 805 at Nanotech 2007, May 22-23 at the Santa Clara Convention Center, Santa Clara, CA.

According to Park Systems' Vice President of Operations, Dr. Sung Park, many AFMs still use a derivative of the original piezoelectric tube scanner that was invented in the 1980's. While at the time, the tube scanner was a versatile, low-cost tool for acquiring attractive images, it was never ideal for obtaining accurate parameters of surface features and was subject to cross-talk.

"To overcome these limitations, Park Systems developed the ‘Cross-Talk Elimination' (XE) Series of AFM/SPMs," said Dr. Park. "The new XE-70 AFM features decoupled XY and Z scanners to minimize background curvature to two nanometers over 50 microns in XY - this is equivalent to about two inches over one mile. Essentially, there is no intrinsic bowing, even on the flattest sample, so there's no need to post-massage your data. Thus, there's no danger of eliminating any subtle information about the sample's surface features."

In recognition of innovations advancing AFM scanner technology, the XE Series was awarded Korea's IR52 Jang Young Shil Award, the Industrial Technology Innovation Award, and was selected as one of Korea's Ten Best New Technologies of 2004.

Additional features of the XE-70 AFM/SPM include:

* Distortion-free imaging and absolute scaling of AFM measurements enabled by a closed-loop feedback system driving all AFM signals.
* Faster, more accurate scanning. The high resonant frequency of the Z scanner provides rapid feedback to accurately track surface features at higher scan speeds.
* Preserves probe tip sharpness and sample purity. Probes follow the steep curvature of a sample precisely in True Non-Contact mode without crashing or being pulled to the surface by Van der Waals force.
* Stable operations. Super-Luminescence Diode (SLD)-based cantilever deflection/detection eliminates mode-hopping-induced noise from laser diodes. This minimizes interactions with optically sensitive samples and eliminates warm-up time.
* Easy probe placement with on-axis optical view of the probe and sample.
* Unprecedented clarity from direct, on-axis straight-down-looking optical view.
* Accurate feature identification enabled by extremely high (1 micron resolution) optical magnification.
* Large sample capacity (up to 100 x 100 x 20 mm thick) eliminates the need to cut up samples before imaging.
* Supports all SPM modes, including scanning capacitance, scanning thermal, scanning Kelvin, and more.
* Streamlined measurement process. EZ-Snap probe-tip exchange utilizes a pre-aligned kinematic chip mount to guarantee identical position of different probe tips without the use of tools or head removal.

####

About Park Systems Corp.
Park Systems Corp. was founded as PSIA in 1997 by Dr. Sang-il Park, a co-founder of Park Scientific Instruments, one of the earliest manufacturers of AFM. After years of research and development in Korea, PSIA unveiled its next-generation AFM in 2002. The XE-100 Series went on to win several awards for innovation, including being selected as one of Korea’s Ten Best New Technologies of 2004.

This year, PSIA changed its name to Park Systems to reflect the company’s focus on total metrological solutions. Forty percent of its staff of 100 – a higher percentage than any of its competitors – are scientists and engineers. This daunting technical force is supported by corporate offices in Korea, Japan and the United States.

Park Systems now offers AFM and SPM (scanning probe microscopes) for both small- and large-sample measurement, Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. In addition, the company also offers an industrial product line that extends the innovative XE technology to a variety of metrological applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, and semiconductors.

For more information, please click here

Contacts:
Park Systems Inc.
3040 Olcott St,
Santa Clara, CA 95054
Tel: +1-408-986-1110
Fax: +1-408-986-1199

Contact: John Janzer

Copyright © PRWeb™

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Superconductivity: Footballs with no resistance - Indications of light-induced lossless electricity transmission in fullerenes contribute to the search for superconducting materials for practical applications February 9th, 2016

SUNY Poly and GLOBALFOUNDRIES Announce New $500M R&D Program in Albany To Accelerate Next Generation Chip Technology: Arrival of Second Cutting Edge EUV Lithography Tool Launches New Patterning Center That Will Generate Over 100 New High Tech Jobs at SUNY Poly February 9th, 2016

Making sense of metallic glass February 9th, 2016

Electron's 1-D metallic surface state observed: A step for the prediction of electronic properties of extremely-fine metal nanowires in next-generation semiconductors February 9th, 2016

Tools

Making sense of metallic glass February 9th, 2016

Chiral magnetic effect generates quantum current: Separating left- and right-handed particles in a semi-metallic material produces anomalously high conductivity February 8th, 2016

Metal oxide sandwiches: New option to manipulate properties of interfaces February 8th, 2016

Researchers discover new phase of boron nitride and a new way to create pure c-BN February 5th, 2016

Events/Classes

Nanotech Security to Present at the Optical Document Security Conference February 11, 2016 February 4th, 2016

New research uses nanotechnology to prevent preterm birth: March of Dimes honors abstract on prematurity at SMFM Annual Meeting February 2nd, 2016

NBC LEARN DEBUTS SIX-PART VIDEO SERIES, “NANOTECHNOLOGY: SUPER SMALL SCIENCE” Produced by NBC Learn in partnership with the National Science Foundation, and narrated by NBC News/MSNBC’s Kate Snow, series highlights leading research in nanotechnology January 25th, 2016

Leti to Host Workshop on New Photonics Applications During SPIE Photonics West: Researchers also Will Present Four Invited Papers At Feb. 13-18 Conference, 14 Papers, Overall January 25th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic