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Home > News > Improving AFM Data Reliability In Nanoelectronics Research, Utilizing Negative-Stiffness Vibration Isolation

April 28th, 2007

Improving AFM Data Reliability In Nanoelectronics Research, Utilizing Negative-Stiffness Vibration Isolation

Abstract:
t was not until long after 1977 that the name nanoelectronics came into use, but Dr. David K. Ferry was already actively engaged in developing some of the worlds smallest transistors. The field, called Ultra-Small Devices at that time in the later part of the1970s, was in its infancy, and Dr. Ferrys research team was one of only four select groups around the world aggressively researching the limits of small electronic devices.

Recently, Dr. Ferry heads up the Nanostructures Research Group at Arizona State University (ASU) in Tempe, a collection of faculty, staff and students working on research in the regimes of nanolithography, and the physics of nanostructures and ultra-small semiconductor devices. The group is a part of the Universitys College of Engineering, Center for Solid State Electronics Research, whose alumni makes up a serious constituency throughout the nanoelectronics universe, in both industry and academia.

Source:
testandmeasurement.com

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