Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > FEI Company receives recognition of excellence in innovation from US Commerce Department

Abstract:
FEI is please to announce that United States Commerce Department has honored the company with a special Recognition of Excellence in Innovation. This award comes on the heels of the unveiling and demonstration of the Phenom-Ed on Capitol Hill last month. The Phenom is the worlds first table top scanning electron microscope (SEM) designed specifically for education.

FEI Company receives recognition of excellence in innovation from US Commerce Department

HILLSBORO, OR | Posted on April 4th, 2007

Robert Cresanti, U.S. Under Secretary of Commerce for Technology, today presented FEI Company (NASDAQ: FEIC) with a special Recognition of Excellence in Innovation. The recognition was accepted by Don Kania, FEI's president and chief executive officer, at the company's headquarters near Portland with more than 250 local employees attending the event. Such recognition is given to local and regional innovators from throughout the United States who have introduced innovative products or services into the market within the last 12 months.



In February 2007, the FEI previewed the educational version of its newly-developed Phenom™ microscope, the world's first tabletop scanning electron microscope (SEM) designed specifically for education, to U.S. Congressional members. Magnifying up to 20,000x - or 20x the range of traditional optical microscopes - this technology will give students access to micro- and nanoscale worlds rarely seen in undergraduate and high school studies.



Citing that nanotechnology is expected to make a significant impact across industries in the competitive global economy, the Commerce Department's Technology Administration saluted FEI with the Recognition of Excellence in Innovation for "creating a remarkable tool that will bring a new teaching dimension to the classroom; foster interest in advanced science, technology, engineering and math education; inspire future scientists and innovators; and increase U.S. competitiveness."



"We are honored to receive this recognition and excited by the prospects of the Phenom in both educational and industrials applications," commented Don Kania, president and CEO of FEI. "We believe the Phenom will play an important role in supporting current public and private investment in nanotechnology by helping to train tomorrow's scientists and enabling today's commercial interests to discover, develop and build on the nanoscale."



The educational version of the Phenom is in the final stages of beta-testing at the Ohio State University, Jackson State University, the University of Oregon, Oregon State University, Chemeketa Community College, Winona State University, and Portland State University. It will be launched in the third quarter of this year. A similar table-top SEM system, optimized for a wide range of industrial applications will also be released this year.



The development of the Phenom represents an important and highly successful collaboration between the Oregon Nanoscience and Microtechnology Institute (ONAMI), universities and FEI. It was funded in part by a federal grant provided to ONAMI (Department of Energy Solar Energy Program under Award Number DE-FG36-06GO86073 and the Department of Energy Biological and Environmental Research under Award Number DE-FG02-06ER64248) and a European Union stimulus grant to FEI.

####

About FEI Company
FEI (NASDAQ: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI’s Tools for Nanotech™ are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: http://www.fei.com .

About the U.S. Technology Administration

The primary mission of the Technology Administration (TA) is to maximize the competitiveness and innovation of the U.S. technology industry and its contribution to America’s economic growth and global leadership. For more information, visit the home page at http://www.technology.gov .

For more information, please click here

Contacts:
Dan Zenka, APR
Global Public Relations
FEI Company
+1 503 726 2695

Copyright © FEI

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Academic/Education

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

Kwansei Gakuin University in Hyogo, Japan, uses Raman microscopy to study crystallographic defects in silicon carbide wafers August 25th, 2015

JPK reports on the use of a NanoWizard® AFM-SECM system at the Université Paris Diderot looking at nanoscale biostructures August 18th, 2015

Rice, Penn State open center for 2-D coatings: National Science Foundation selects universities to develop atom-thin materials with industry partners August 13th, 2015

Announcements

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

Grants/Awards/Scholarships/Gifts/Contests/Honors/Records

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

How UEA research could help build computers from DNA August 19th, 2015

'Quantum dot' technology may help light the future August 19th, 2015

Exercise-induced hormone irisin is not a 'myth' August 14th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic