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Home > Press > Keithley Announces Nano Days Online Educational Event

Abstract:
Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces Nano Days, a unique, on-line nanotechnology educational event from April 24 through April 26, 2007. During this virtual conference, the theme of which is VISUALIZE, CHARACTERIZE, REALIZE: The Future of Nanotechnology, leading researchers from academia and business leaders from industry will present cutting edge measurement technology for nanoscale devices and materials. For more information about the conference presentations or to register, visit http://www.keithley.com/nanodays. There is no charge to attend the three-day event.

Keithley Announces Nano Days Online Educational Event

Cleveland, OH | Posted on March 27th, 2007

Six live audio/visual seminars will be held during Nano Days. Two back-to-back seminars will be held each day of the three-day conference. Each seminar is approximately 45 minutes long and includes interactive question and answer during each seminar. Seminar topics and presenters include:

-- Advanced particle beam methods for nano-characterization and
analysis
-- Dr. Jens Greiser, FEI Company

-- In-situ correlation of mechanical properties, deformation behavior
and electrical characteristics of materials using conductive
nano-identification
-- Ryan C. Major, Ph.D., Sr. Staff Scientist, Hysitron, Inc.

-- How to avoid self-heating effects on nanoscale devices
-- Jonathan Tucker, Keithley Instruments, Inc.

-- Give your microscope a hand: Characterization of nanostructures
-- G. Frayne, S. Kleindiek, B. Volbert, Kleindiek Nanotechnik

-- Electronic properties of zinc-blende wurtzite biphasic GaN
nanowires and nanoFETs
-- Mr. Benjamin W. Jacobs and Dr. Virginia M Ayres, Michigan State
University

-- Measurement needs in nano-architectonics
-- Dr. Kang L. Wang, Director of MARCO Focus Center on Functional
Engineered Nano Architectonics (FENA) and Director of the
Western Institute of Nanoelectronics (WIN)

Keithley Instruments is the world leader in the creation of electrical measurement solutions for nanotechnology. This important new area of research promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. With their unequalled performance, Keithley measurement tools enable nanotechnology researchers to observe phenomena that were impossible just a few years ago. Unlocking secrets at the nanoscale level is accelerating the transition from nanotech research labs to commercial production.

For More Information

For more information on Nano Days, including dates, times, and contents of the free seminars, or to register, visit www.keithley.com/nanodays. For information on Keithley's nanotechnology products and resources, visit http://www.keithley.com/nano, or contact the Company at:
Telephone: 800-688-9951
440-248-0400

Fax:
440-248-6168
E-mail:


Internet:

http://www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

####

About Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

For more information, please click here

Contacts:
Keithley Instruments, Inc.
Ellen Modock, 440-498-2746

Reader Inquiries: 1-800-688-9951

Copyright © Business Wire 2007

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