- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
OSPrey800's unique non-destructive quality control technique for measuring OSP thickness requires neither test coupons nor sample preparation
Oxford Instruments announces the launch of the revolutionary new OSPrey800 to the printed circuit board industry. This instrument measures Organic Solderablity Preservative (OSP) thickness on the individual pads of real-time production boards. The ability to target individual pads allows specific quality control, failure analysis and troubleshooting of the OSP layer. The OSPrey800's unique non-destructive quality control technique requires neither test coupons nor sample preparation and significantly reduces the time needed to take measurements and operator error.
Other techniques for measuring OSP thickness are either destructive, labor intensive, or expensive. The OSPrey800 utilizes an innovative new technique in which various wavelengths of light are aimed at a sample and the light reflected from the surface of coating and substrate is analyzed to determine coating thickness. Typical thicknesses from 0.035-3µm can be measured and analyzed.
The mechanical shear strength and electrical conductivity of the board rely upon the thickness and integrity of the OSP coating. With the OSPrey800, measurements can be made on the same board when it is newly coated with OSP, in the incoming board quality inspection at facility and after a trip through the reflow oven.
The Windows™ based user interface was designed with intuitive controls for use by production personnel. The user can simultaneously view a CCD image of the surface, a two-dimensional map of the coating thickness and a graphic display of wavelength versus reflectance.
Oxford Instruments' CMI series XRF systems have been reliably measuring Electroless Nickel Immersion Gold (ENIG), Hot Air Solder Leveling (HASL), Immersion Silver (Im-Ag) and Immersion Tin (Im-Sn) for many years. The OSPrey800 measures OSP thickness, completing the product line for measuring all major PCB surface finishes.
Oxford Instruments Industrial Analysis
OIIA offers a range of Analytical Instruments designed for demanding quality control applications. From materials analysis to thickness gauging, the Industrial Analysis products incorporate the latest in available technology, coupled with over 30 years of experience in designing, producing and supporting world class instruments.
Our X-MET handheld X-ray Fluorescence (XRF) analysers and ARC-MET mobile Optical Emission (OES) analysers are specifically designed for positive material identification, alloy analysis and identification and X-METs for hazardous material analysis (RoHS).
Our Lab-X, Twin-X, ED2000 and MDX1000 XRF spectrometers span the price/performance range for routine chemical analysis. From Sulfur in petroleum products to the analysis of limestone, we can match exactly the correct spectrometer to your needs, as we have the broadest range available in the industry.
For thickness gauging applications we offer handheld magnetic and eddy current gauges to full function, high performance XR systems. Our recently introduced X-Strata960 provides world-class performance.
About Oxford Instruments
Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions with a focus on physical science, bioscience, environmental and industrial research and applications. It provides solutions needed to advance fundamental nanoscience research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 40 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University over forty years ago, Oxford Instruments is now a global company with over 1,300 staff worldwide and a listing on the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the Physical Science and Bioscience sectors.
This involves the combination of core technologies in areas such as low temperature and high magnetic field environments, Nuclear Magnetic Resonance, X-ray electron and optical based metrology, and advanced growth, deposition and etching. Our products, expertise, and ideas address global issues such as energy, environment, terrorism and health and are part of the next generation of telecommunications, energy products, environmental measures, security devices, drug discovery and medical advances.
For more information, please click here
Stephanie Kowalyk, Marketing Communications Manager
Oxford Instruments Industrial Analysis
Copyright © Oxford InstrumentsIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Lehigh engineer discovers a high-speed nano-avalanche: New findings published in the Journal of Electrochemical Society about the process involving transformations in glass that occur under intense electrical and thermal conditions could lead the way to more energy-efficient glas August 24th, 2016
University of Puerto Rico and NASA back in the news – XEI reports August 23rd, 2016
Spider silk: Mother Nature's bio-superlens August 22nd, 2016
Tracing barnacle's footprint August 19th, 2016
XEI Scientific celebrates its Silver Anniversary August 16th, 2016