Home > News > NIST Report Addresses Scientific and Technical Measurement Challenges Key to Sustaining U.S. Innovation
February 12th, 2007
NIST Report Addresses Scientific and Technical Measurement Challenges Key to Sustaining U.S. Innovation
A new report based on an analysis of more than 700 scientific and technical measurement challenges facing U.S. industry today, calls on the public and private sectors to address those challenges by crafting a "strategic, long-term approach" designed to sustain U.S. innovation at a world-leading pace.
The call for collaboration is one of several key messages contained in An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate Innovation, a new report from the Commerce Department's National Institute of Standards and Technology (NIST).
The reportis the product of a NIST-led survey and analysis of measurement-related needs for supporting innovation across a sample of 11 industrial sectors and technology areas. These ranged from materials to software and from building and construction to nanotechnology. In all, more than 1,000 people in industry, academia and government were involved in the study. Examples of the measurement challenges identified included the need for versatile, high-accuracy methods to measure the three-dimensional geometry of manufactured products and the need for tools for measuring the properties of nanodevices and materials.
Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers
Carbon nanoballs can greatly contribute to sustainable energy supply January 27th, 2015
The laser pulse that gets shorter all by itself: Ultrashort laser pulses have become an indispensable tool for atomic and molecular research; A new technology makes creating short infrared pulses easy and cheap January 27th, 2015
New pathway to valleytronics January 27th, 2015
Stomach acid-powered micromotors get their first test in a living animal January 27th, 2015
OCSiAl supports NanoART Imagery Contest January 23rd, 2015
EnvisioNano: An image contest hosted by the National Nanotechnology Initiative (NNI) January 22nd, 2015
Oxford Instruments Asylum Research Announces AFM Image Contest Winners January 11th, 2015
Longhorn beetle inspires ink to fight counterfeiting November 5th, 2014