- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
January 9th, 2007
Hitachi High-Technologies has announced the launch of the HD-2700 ultra-high resolution scanning transmission electron microscope (Stem). This instrument is characterised by new electron optics which now includes a spherical aberration correction system (developed in collaboration with CEOS). By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens.
The HD-2700 has applications in materials science, semiconductors and nanotechnology, both in research and development and quality control.
|Related News Press|
Superfast light source made from artificial atom April 28th, 2016
Chemists use DNA to build the world's tiniest thermometer April 27th, 2016
Bruker Introduces First of Its Kind Dimensional Analysis System: The Novel Contour CMM™ System Fully Integrates 3D Coordinate Measurements with Nanoscale Surface Height, Texture, Waviness and Form Characterization April 26th, 2016