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January 9th, 2007
Hitachi High-Technologies has announced the launch of the HD-2700 ultra-high resolution scanning transmission electron microscope (Stem). This instrument is characterised by new electron optics which now includes a spherical aberration correction system (developed in collaboration with CEOS). By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens.
The HD-2700 has applications in materials science, semiconductors and nanotechnology, both in research and development and quality control.
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