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Home > News > Hyphenated Systems Unveils New Automated Nanoscale Optical Profiler

December 5th, 2006

Hyphenated Systems Unveils New Automated Nanoscale Optical Profiler

Abstract:
Hyphenated Systems, a provider of hybrid microscopy solutions for three-dimensional imaging and metrology in micro and nanotechnology, announced recently the release of its new HS200A NanoScale Optical Profiler. According to the company, the HS200A adds extensive automation capability to the Hyphenated Systems workhorse - the HS200OP - for the fastest, most repeatable non-destructive analyses in critical metrology, inspection, failure analysis and quality control applications.

Source:
testandmeasurement.com

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