Home > News > Hyphenated Systems Unveils New Automated Nanoscale Optical Profiler
December 5th, 2006
Hyphenated Systems Unveils New Automated Nanoscale Optical Profiler
Abstract:
Hyphenated Systems, a provider of hybrid microscopy solutions for three-dimensional imaging and metrology in micro and nanotechnology, announced recently the release of its new HS200A NanoScale Optical Profiler. According to the company, the HS200A adds extensive automation capability to the Hyphenated Systems workhorse - the HS200OP - for the fastest, most repeatable non-destructive analyses in critical metrology, inspection, failure analysis and quality control applications.
Source:
testandmeasurement.com
Related News Press |
Announcements
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||