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WITec, a specialist in high-resolution optical and scanning probe microscopy has launched a new modular microscope generation, the alpha300 series. This series includes the Confocal Raman Microscope "alpha300 R", the Scanning Near-field Optical Microscope "alpha300 S" and the Atomic Force Microscope "alpha300 A" all driven by the new fully digital control unit "alphaControl".
WITec, a specialist in high-resolution optical and scanning probe microscopy has launched a new modular microscope generation, the alpha300 series. This series includes the Confocal Raman Microscope "alpha300 R", the Scanning Near-field Optical Microscope "alpha300 S" and the Atomic Force Microscope "alpha300 A" all driven by the new fully digital control unit "alphaControl." The controller’s revolutionary new system-on-a-chip concept enhances not only user friendliness but also speed, flexibility, accuracy, expandability and timing precision. It enables various new features and automatic measurement procedures to be employed for the first time. The digital signal processing reduces noise to extremely low levels and significantly enhances data and image quality. The integrated software for measurement control is the key to the unique features of the alpha300 series. It navigates the user through the measurement tasks while intuitively providing a user interface that changes automatically depending on the method used. This also reflects the modular concept of the alpha300 series which allows the combination of different microscopy techniques in one instrument. The new microscope generation is ideally suited for applications in Materials Sciences, Life Sciences, Pharmaceutics and Nanotechnology where a comprehensive understanding of the sample structure and composition is a necessity.
"The new alpha300 series addresses three different markets at the same time. These are SPM, optical confocal Microscopy and chemical Raman Microscopy, all offering increasing market potential and opportunities" says Dr. Joachim Koenen, Managing Director of WITec GmbH. "Most of the new features are available for the first time and are only possible with a full digital control unit." For advanced scanning probe microscopy imaging tasks, the alpha300 series integrates TrueScanTM, a dynamic position error correction system of the closed loop scan stage for the highest accuracy in scan movement. Additionally, the ability to perform high speed frequency scans, also leads to lower measurement times. Fully automated procedures such as the high-speed cantilever approach, the adjustment of cantilever focus and position or the light intensity adjustment facilitate straightforward operation and ease-of-use. Light sensitive detectors for optical microscopy are guarded with a built-in high-speed overload protection. For creative users with advanced measurement tasks, the alpha300 system is expandable and allows complete access to internal signals.
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