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Home > News > New Device Revolutionizes Nano Imaging

February 9th, 2006

New Device Revolutionizes Nano Imaging

Abstract:
Georgia Tech researchers have created a highly sensitive atomic force microscopy (AFM) technology capable of high-speed imaging 100 times faster than current AFM. This technology could prove invaluable for many types of nano-research, in particular for measuring microelectronic devices and observing fast biological interactions on the molecular scale, even translating into movies of molecular interactions in real time. The research, funded by the National Science Foundation and the National Institutes of Health, appears in the February issue of Review of Scientific Instruments.

Source:
Georgia Tech

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FEI Launches Apreo Industry-Leading Versatile, High-Performance SEM: The Apreo SEM provides high-resolution surface information with excellent contrast, and the flexibility to accommodate a large range of samples, applications and conditions May 4th, 2016

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