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Home > Press > NANOSENSORS™ introduces Q30K-Plus Silicon AFM probes

NANOSENSORS™ introduces Q30K-Plus Silicon AFM probes for UHV applications

Neuchâtel, Switzerland | Posted on January 27, 2006

The new NANOSENSORS™ Q30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications was introduced today.

Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm.

The Q30K-Plus™ AFM probe is available in the following types and package sizes:

PPP-QNCHR-10 for Non-Contact Mode/Tapping Mode™

Typical Values:

  • Force Constant = 42 N/m
  • Resonance Frequency = 330 kHz
  • Cantilever Length = 125 µm
  • Cantilever Width = 30 µm
  • Quality Factor = 30000

Packages of 10 probes

PPP-QFMR-10 for Force Modulation Mode

Typical Values:

  • Force constant = 2.8 N/m
  • Resonance frequency = 75 kHz
  • Cantilever length = 225 µm
  • Cantilever width = 28 µm
  • Quality Factor = 30000

Packages of 10 probes

For further information please refer to the NANOSENSORS™ Website at or contact

Michaela Roessger


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