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Asylum Research, a leading manufacturer of atomic force microscopes (AFMs), announces the availability of the new Variable Field Module (VFM)™ for use with the Asylum Research MFP-3D™ AFM System. The VFM applies an in-plane magnetic field to a sample exceeding + 2,000 Oersted with < 1 Oersted resolution. The VFM is useful for magnetic force microscopy (MFM), conductance, and other applications where the sample has a dependence on the applied field.
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.
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