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Home > News > Imago Scientific Instruments: LEAP 3000 Metrology System

August 19th, 2005

Imago Scientific Instruments: LEAP 3000 Metrology System

Abstract:
This unique nano-metrology tool has proven valuable in providing solutions to challenges facing researchers in the advanced materials field such as the study of point defects related to the embrittlement process, irradiation induced precipitation, matrix damage and grain boundary segregation.

Source:
wisbusiness.com

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