Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Veeco to host Seeing at the Nanoscale III

Abstract:
International Researchers Scheduled to Present at 3rd Annual Nanoscience Conference; Keynote Speaker Announced

Veeco to host Seeing at the Nanoscale III

May 26, 2005

Veeco Instruments Inc. (Nasdaq: VECO) announced today that it will host the "Seeing at the Nanoscale III" conference being held at the University of California, Santa Barbara (UCSB), from August 13-16, 2005. The conference, now in its third year, provides an optimum forum for scientists to 'speak to scientists' on a wide variety of cutting-edge nanotechnology topics. Masakazu Aono of the National Institute for Materials Science (NIMS) Japan, will be this year's keynote speaker. Evelyn Hu, California NanoSystems Institute (CNSI), is the conference advisor.

Conference registration and further details are available here.

The theme of the three-day symposium, which is sponsored in conjunction with CNSI and UCSB, is "Exploring Nanostructure Imaging, Characterization and Modification using Scanning Probe Microscopy and Related Techniques." Several hundred international researchers and scientists have attended the prior years' events.

Don Kania, Ph.D., Veeco's President, commented, "In our third year, we are returning to Santa Barbara, which is both a beautiful location and a key center of nano-research. We expect "Seeing at the Nanoscale" to continue to be a premier international scientific forum for those involved in nanoscience from both academia and industry. Nanostructural imaging, characterization, and modification utilizing scanning probe microscopy is revolutionizing scientific research. This conference is a tremendous opportunity for scientists worldwide to discuss their latest discoveries."

Session topics for "Seeing at the Nanoscale III" will be as follows:

  • Session 1: Visualization I: Biomolecules and Biological Processes/ Chair: Christopher Yip, University of Toronto
  • Session 2: Nanomechanical & Local Property Measurements/ Chair: Walter Arnold, Fraunhofer Institute, Germany
  • Session 3: Visualization II: Materials and Polymer Systems/ Chair: Sergei Magonov, Veeco Instruments
  • Session 4: Measurements of Electrical, Optical, Magnetic and Thermal Properties of Materials at the Nanoscale/ Chair: Sergei Kalinin, Oak Ridge National Laboratory
  • Session 5: Instrumentation: New Tools and Techniques for Nanoscience/ Chair: Martin Moskovits, UCSB

####

About Veeco Instruments:
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide, data storage, HB-LED/wireless, semiconductor and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific.

To the extent that this news release discusses expectations about market condition, market acceptance and future sales of Veeco's products, Veeco's future financial performance, or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the cyclical nature of the compound semiconductor/wireless, data storage, semiconductor and research markets, risks associated with integrating acquired businesses and the acceptance of new products by individual customers and by the marketplace and other factors discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K, subsequent Quarterly Reports on Form 10-Q and current reports on Form 8-K .

For more information, visit www.veeco.com


Contact:
Veeco Instruments Inc.
Debra Wasser
VP of Investor Relations & Corp. Comm.
516-677-0200 x1472

Trade Media:
Joan Horwitz Director of Marcom, Veeco Metrology
805-967-1400

Copyright © Veeco

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Research brief: UMN researchers use green gold to rapidly detect and identify harmful bacteria August 15th, 2018

Particles pull last drops of oil from well water: Rice University engineers find nanoscale solution to 'produced water' problem August 15th, 2018

How hot is Schrödinger's coffee? August 15th, 2018

CTI Materials drives nano commercialization with it's patented surfactant free nanoparticle dispersions August 15th, 2018

Tools

Nanometrics Delivers 100th: Atlas III System for Advanced Process Control Metrology Atlas III: Systems are qualified and in production for advanced devices in DRAM, 3D-NAND and Foundry/Logic August 2nd, 2018

Picosun’s ALD solutions make quality watches tick July 26th, 2018

Nanometrics Announces Participation in Upcoming Investor Conferences July 25th, 2018

Researchers use nanotechnology to improve the accuracy of measuring devices July 24th, 2018

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project