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Home > News > Conductive tips for atomic force microscopy

May 24th, 2005

Conductive tips for atomic force microscopy

Abstract:
Researchers in Switzerland have tested an atomic force microscope with an electrically insulated conductive tip. The scientists, from the University of Basel and University of Neuchâtel, imaged the hexagonally packed intermediate layer of the red bacterium Deinococcus radiodurans.

“This is the first time that an image of better than 10 nm resolution has been generated using the Faraday current,” Andreas Engel of the University of Basel.

Source:
nanotechweb

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