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Home > News > FEI Introduces Nova(TM) NanoSEM

March 1st, 2005

FEI Introduces Nova(TM) NanoSEM

Abstract:
FEI Company today released the newest member of its Nova(TM) family of SEM and DualBeam(TM) systems, the Nova NanoSEM. It is the world's first low-vacuum, field emission scanning electron microscope (FEG-SEM) solution for ultra-high resolution characterization of charging and/or contaminating samples such as organic materials, substrates, porous materials, plastics and polymers.

Source:
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