Nanotechnology Now

Our NanoNews Digest Sponsors


Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Malvern launches new web resource for protein researchers

Abstract:
A new and dedicated protein characterization section added

Malvern launches new web resource for protein researchers

January 14, 2005

Malvern Instruments has added a new and dedicated protein characterization section to its website. This new section provides comprehensive information about the use and applications of light scattering techniques in protein studies and will be a valuable resource for anyone working in this field.

Detailed narratives and case studies provide information about crystal screening, protein melting point measurement and protein formulation stability, together with an explanation of hydrodynamic radius and the measurement of absolute molecular weight. A wide range of freely downloadable audiovisual presentations delivers seminars to the visitor's desktop, and an extensive selection of fully accessible application notes provides in-depth examples of the use and applications of light scattering techniques.

Since its launch in 2003, Malvern's Zetasizer Nano particle characterization system, which uses both dynamic and static light scattering technologies, has become widely adopted for the study of proteins. It is now the method of choice in many laboratories for screening proteins prior to crystallization.

Malvern's new protein pages can be accessed directly at www.malvern.co.uk/proteins or click 'Proteins' in the 'Industry Solutions' menu on the Malvern home page at www.malvern.co.uk.

About Malvern Instruments
Malvern Instruments is a leading supplier of analytical solutions for particle characterization and rheological applications. Advanced technologies are combined with robust mechanical designs and comprehensive software to provide systems that measure material characterization data (size distribution, particle shape, zeta potential, molecular weight) and bulk material properties. On-line, at-line and off-line solutions are provided to meet QA/QC, control and development applications across a diverse range of industries. An extensive support service facilitates the optimal design and exploitation of any given system.


Contact:
Trish Appleton, Kapler Communications
Suite 2, Cressner House
12 Huntingdon Street, St Neots
Cambridgeshire UK
PE19 1BD
Tel: +44 (0) 1480 471117
Fax: +44 (0) 1480 471118
trish@kapleronline.com

USA contact:
Marisa Fraser, Malvern Instruments Inc
10 Southville Road
Southborough, MA 01772, USA
Tel: +1 508 480 0200
Fax: +1 508 460 9692
marisa.fraser@malvernusa.com

Please send sales enquiries to:
Alison Vines, Malvern Instruments Ltd
Enigma Business Park, Grovewood Road
Malvern, Worcestershire UK
WR14 1XZ
Tel: +44(0) 1684 892456
Fax: +44 (0) 1684 892789
salesinfo@malvern.co.uk

Copyright © Malvern Instruments

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Hybrid nanoantennas -- next-generation platform for ultradense data recording April 28th, 2016

Superfast light source made from artificial atom April 28th, 2016

Arrowhead Pharmaceuticals Files for Regulatory Clearance to Begin Phase 1/2 Study of ARC-521 April 28th, 2016

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

Tools

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Chemists use DNA to build the world's tiniest thermometer April 27th, 2016

Bruker Introduces First of Its Kind Dimensional Analysis System: The Novel Contour CMM™ System Fully Integrates 3D Coordinate Measurements with Nanoscale Surface Height, Texture, Waviness and Form Characterization April 26th, 2016

Bruker Introduces Dimension FastScan Pro Industrial AFM: Providing Nanometer-Resolution at High Scan Rates for up to 300-mm Samples April 26th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic