Home > Press > Bringing the atomic world into full color: Researchers turn atomic force microscope measurements into color images
This is an example of silicon atoms represented in color. CREDIT 2017 Hideki Kawakatsu, Kawakatsu Laboratory, Institute of Industrial Science, The University of Tokyo. |
Abstract:
A French and Japanese research group has developed a new way of visualizing the atomic world by turning data scanned by an atomic force microscope into clear color images. The newly developed method, which enables observation of materials and substances like alloys, semiconductors, and chemical compounds in a relatively short time, holds promise of becoming widely used in the research and development of surfaces and devices.
Individual molecules and atoms are much smaller than the wavelengths of light that we can see. Visualizing such tiny structures requires special instruments that often provide black-and-white representations of the positions of atoms. Atomic force microscopes (AFMs) are among the most powerful tools available for probing surfaces at the atomic scale level. A nanoscale tip moving over a surface can not only give all kinds of information about the physical positions of atoms but also give data on their chemical properties and behavior. However, much of this information is lost when the AFM signals are processed.
Now, researchers centered at the University of Tokyo's Institute of Industrial Science (IIS), led by Professor Hideki Kawakatsu, have created a new way of operating AFMs and visualizing the data to extract structural and chemical information into clear, full-color images. These findings were recently published in Applied Physics Letters.
"AFM is an extremely versatile technique and our approach of linking the AFM tip height to the bottom of the frequency curve enabled us to perform measurements at the same time but without the risk of losing information from the surface," study lead author Pierre Etienne Allain, a LIMMS/CNRS-IIS postdoctoral researcher, says.
People often perform AFM measurements by keeping the AFM tip at a fixed height while measuring changes in its vibrations as it interacts with the surface. Alternatively, it is possible to move the AFM tip up and down so that the frequency of the vibrations stays the same. Both these approaches have their advantages, but they also carry disadvantages in that one can be very time consuming, and the other can result in loss of information.
The IIS-led researchers developed a way of moving the AFM tip and transforming the data so the tip stays above the surface in a position where the vibrational frequency is strongly influenced by the surface.
Another benefit of this approach is that the model yields three variables, to which the researchers assigned the colors red, blue, and green, respectively, thereby enabling them to produce full-color images. They also successfully tested their method on a silicon surface.
"If the colors in the image are the same, we can say the signals come from the same type of atom and surroundings," coauthor and fellow postdoctoral researcher Denis Damiron says. "This new way of representing complex chemical and physical information from a surface could let us probe the movements and behavior of atoms in unprecedented detail."
Collaborating institutions:
CNRS
The University of Electro-Communications
Funding:
CNRS, MEXT, JST, IIS UTokyo, the JSPS Postdoctoral Fellowship and Core-to-Core Programs
####
About University of Tokyo
The University of Tokyo is Japan's leading university and one of the world's top research universities. The vast research output of some 6,000 researchers is published in the world's top journals across the arts and sciences. Our vibrant student body of around 15,000 undergraduate and 15,000 graduate students includes over 2,000 international students. Find out more at http://www.u-tokyo.ac.jp/en/ or follow us on Twitter at @UTokyo_News_en.
For more information, please click here
Contacts:
Research contact:
Professor Hideki Kawakatsu
Centre for Interdisciplinary Research on Micro-Nano Methods (CIRMM), Institute of Industrial Science, The University of Tokyo
4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Tel: +81-3-5452-6201
Fax:+81-3-5452-6199
Email:
Press officer contact:
Megumi Ijichi
Public Relations Office
Institute of Industrial Science, The University of Tokyo
4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Tel: +81-3-5452-6738
Fax: +81-3-5452-6746
Email:
Copyright © University of Tokyo
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related Links |
Institute of Industrial Science, The University of Tokyo:
Related News Press |
News and information
Researchers develop artificial building blocks of life March 8th, 2024
Imaging
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
Observation of left and right at nanoscale with optical force October 6th, 2023
Videos/Movies
New X-ray imaging technique to study the transient phases of quantum materials December 29th, 2022
Solvent study solves solar cell durability puzzle: Rice-led project could make perovskite cells ready for prime time September 23rd, 2022
Scientists prepare for the world’s smallest race: Nanocar Race II March 18th, 2022
Visualizing the invisible: New fluorescent DNA label reveals nanoscopic cancer features March 4th, 2022
Govt.-Legislation/Regulation/Funding/Policy
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Researchers’ approach may protect quantum computers from attacks March 8th, 2024
Optically trapped quantum droplets of light can bind together to form macroscopic complexes March 8th, 2024
Possible Futures
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Chip Technology
New chip opens door to AI computing at light speed February 16th, 2024
HKUST researchers develop new integration technique for efficient coupling of III-V and silicon February 16th, 2024
NRL discovers two-dimensional waveguides February 16th, 2024
Discoveries
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Researchers’ approach may protect quantum computers from attacks March 8th, 2024
High-tech 'paint' could spare patients repeated surgeries March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Announcements
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers/Posters
Researchers develop artificial building blocks of life March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
Grants/Sponsored Research/Awards/Scholarships/Gifts/Contests/Honors/Records
'Sudden death' of quantum fluctuations defies current theories of superconductivity: Study challenges the conventional wisdom of superconducting quantum transitions January 12th, 2024
Research partnerships
Researchers’ approach may protect quantum computers from attacks March 8th, 2024
'Sudden death' of quantum fluctuations defies current theories of superconductivity: Study challenges the conventional wisdom of superconducting quantum transitions January 12th, 2024
Development of zinc oxide nanopagoda array photoelectrode: photoelectrochemical water-splitting hydrogen production January 12th, 2024
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||