Nanotechnology Now

Our NanoNews Digest Sponsors


Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > XEI Scientific reports a novel approach to removing silicone-based contamination in a recent publication in JVST(A)

Abstract:
XEI Scientific Inc, manufacturer of the popular EVACTRON® De-Contaminator™ Plasma Cleaning System for electron microscopes and other vacuum chambers, is pleased to announce the publication of a paper in collaboration with General Electric's Global Research Center on the use of in-situ plasma cleaning. The paper appears in the Journal of Vacuum Science & Technology A.

XEI Scientific reports a novel approach to removing silicone-based contamination in a recent publication in JVST(A)

Redwood City, CA | Posted on November 4th, 2013

Contamination, even at extremely low levels, can often hide or distort analyses of surfaces that researchers would like to study. Such is the case of many of the samples analysed at General Electric's Global Research Center in New York. Attempts to study "as received" samples by time of flight secondary ion mass spectrometry (ToF-SIMS) reveal a contamination signature that has come from processing, handling and/or a specific exposure. ToF-SIMS provides high surface specificity so that contamination by hydrocarbons and/or silicones may actually mask the surface features of interest, which may inhibit or compromise accurate analysis. While use of remote plasmas to mitigate hydrocarbon contamination is established technology, this paper represents the first demonstration that silicones (in this case, polydimethylsiloxame) can be removed as well.

In the paper, "In-situ plasma cleaning of samples to remove hydrocarbon and/or polydimethylsiloxame prior to ToF-SIMS analysis1", lead author Vincent Smentkowski reports on the use of an Evactron® air-based remote plasma for cleaning of samples. This approach is preferred to sputter cleaning as the latter often changes the chemistry on the surface under analysis. Here, samples were cleaned in the load lock of a commercially available ToF-SIMS instrument immediately prior to analysis. The experimental observations show that the Evactron system produces no ion beam effects (sputtering) with even extended exposure, thus showing minimal artifacts from material removal and ion bombardment. This advantage results from the design of the Evactron RF plasma cleaner which minimizes ion formation and downstream sputtering, allowing radical species to dominate the cleaning process.

It is interesting to note that plasmas generated using ambient air result in surface oxidation and this is often beneficial through the increase in sensitivity of ToF-SIMS where the ion yield of many elements is enhanced. This paper demonstrates the potential for the use of plasma cleaning not only for basic analyses but in a production environment as well.

XEI has sold more than 1800 Evactron systems worldwide solving contamination problems in many different environments using instrumentation such as electron microscopes, FIBs and other vacuum sample chambers. Please visit our web site for the latest details, www.evactron.com.

1Reference: J. Vac. Sci. Technol. A 31, 06F105 (2013); doi: 10.1116/1.4822516

####

About XEI Scientific Inc.
XEI Scientific Inc. invented the Evactron De-Contaminator in 1999 as the first plasma cleaner to use a downstream cleaning process to remove carbon from electron microscopes. A proprietary plasma source uses air to produce oxygen radicals for oxidation of carbon compounds for removal by the pumps. Carbon-free-vacuum produces the highest quality images and analytical results from SEMs and other vacuum analytical instruments. XEI innovations include a unique RF plasma generator, a patented RF electrode, and easy start programmed plasma cleaning. All XEI products come with a 5 year warranty and are compliant with CE, NRTL, and Semi-S2 safety standards. XEI offers a variety of Evactron® decontamination systems to meet user needs and >1800 installations around the world.

For more information, please click here

Contacts:
XEI Scientific, Inc
1755 E Bayshore Road
Redwood City
CA 94063, USA
T +1 (650) 369-0133
F +1 (650) 363-1659
www.evactron.com


Talking Science Limited
39 de Bohun Court
Saffron Walden
Essex CB10 2BA UK
T +44 (0)1799 521881
M +44 (0)7843 012997
www.talking-science.com

Copyright © XEI Scientific Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Personal cooling units on the horizon April 29th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

Arrowhead Pharmaceuticals Files for Regulatory Clearance to Begin Phase 1/2 Study of ARC-521 April 28th, 2016

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Imaging

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Announcements

Personal cooling units on the horizon April 29th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

Arrowhead Pharmaceuticals Files for Regulatory Clearance to Begin Phase 1/2 Study of ARC-521 April 28th, 2016

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers

Personal cooling units on the horizon April 29th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

Researchers create a first frequency comb of time-bin entangled qubits: Discovery is a significant step toward multi-channel quantum communication and higher capacity quantum computers April 28th, 2016

Hybrid nanoantennas -- next-generation platform for ultradense data recording April 28th, 2016

Tools

Exploring phosphorene, a promising new material April 29th, 2016

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Chemists use DNA to build the world's tiniest thermometer April 27th, 2016

Bruker Introduces Dimension FastScan Pro Industrial AFM: Providing Nanometer-Resolution at High Scan Rates for up to 300-mm Samples April 26th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic