Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > XEI Scientific reports a novel approach to removing silicone-based contamination in a recent publication in JVST(A)

Abstract:
XEI Scientific Inc, manufacturer of the popular EVACTRON® De-Contaminator™ Plasma Cleaning System for electron microscopes and other vacuum chambers, is pleased to announce the publication of a paper in collaboration with General Electric's Global Research Center on the use of in-situ plasma cleaning. The paper appears in the Journal of Vacuum Science & Technology A.

XEI Scientific reports a novel approach to removing silicone-based contamination in a recent publication in JVST(A)

Redwood City, CA | Posted on November 4th, 2013

Contamination, even at extremely low levels, can often hide or distort analyses of surfaces that researchers would like to study. Such is the case of many of the samples analysed at General Electric's Global Research Center in New York. Attempts to study "as received" samples by time of flight secondary ion mass spectrometry (ToF-SIMS) reveal a contamination signature that has come from processing, handling and/or a specific exposure. ToF-SIMS provides high surface specificity so that contamination by hydrocarbons and/or silicones may actually mask the surface features of interest, which may inhibit or compromise accurate analysis. While use of remote plasmas to mitigate hydrocarbon contamination is established technology, this paper represents the first demonstration that silicones (in this case, polydimethylsiloxame) can be removed as well.

In the paper, "In-situ plasma cleaning of samples to remove hydrocarbon and/or polydimethylsiloxame prior to ToF-SIMS analysis1", lead author Vincent Smentkowski reports on the use of an Evactron® air-based remote plasma for cleaning of samples. This approach is preferred to sputter cleaning as the latter often changes the chemistry on the surface under analysis. Here, samples were cleaned in the load lock of a commercially available ToF-SIMS instrument immediately prior to analysis. The experimental observations show that the Evactron system produces no ion beam effects (sputtering) with even extended exposure, thus showing minimal artifacts from material removal and ion bombardment. This advantage results from the design of the Evactron RF plasma cleaner which minimizes ion formation and downstream sputtering, allowing radical species to dominate the cleaning process.

It is interesting to note that plasmas generated using ambient air result in surface oxidation and this is often beneficial through the increase in sensitivity of ToF-SIMS where the ion yield of many elements is enhanced. This paper demonstrates the potential for the use of plasma cleaning not only for basic analyses but in a production environment as well.

XEI has sold more than 1800 Evactron systems worldwide solving contamination problems in many different environments using instrumentation such as electron microscopes, FIBs and other vacuum sample chambers. Please visit our web site for the latest details, www.evactron.com.

1Reference: J. Vac. Sci. Technol. A 31, 06F105 (2013); doi: 10.1116/1.4822516

####

About XEI Scientific Inc.
XEI Scientific Inc. invented the Evactron De-Contaminator in 1999 as the first plasma cleaner to use a downstream cleaning process to remove carbon from electron microscopes. A proprietary plasma source uses air to produce oxygen radicals for oxidation of carbon compounds for removal by the pumps. Carbon-free-vacuum produces the highest quality images and analytical results from SEMs and other vacuum analytical instruments. XEI innovations include a unique RF plasma generator, a patented RF electrode, and easy start programmed plasma cleaning. All XEI products come with a 5 year warranty and are compliant with CE, NRTL, and Semi-S2 safety standards. XEI offers a variety of Evactron® decontamination systems to meet user needs and >1800 installations around the world.

For more information, please click here

Contacts:
XEI Scientific, Inc
1755 E Bayshore Road
Redwood City
CA 94063, USA
T +1 (650) 369-0133
F +1 (650) 363-1659
www.evactron.com


Talking Science Limited
39 de Bohun Court
Saffron Walden
Essex CB10 2BA UK
T +44 (0)1799 521881
M +44 (0)7843 012997
www.talking-science.com

Copyright © XEI Scientific Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

PetLife Comments on CNN Story on Scorpion Venom Health Benefits August 27th, 2014

Nanodiamonds Are Forever: A UCSB professor’s research examines 13,000-year-old nanodiamonds from multiple locations across three continents August 27th, 2014

Aspen Aerogels, Inc. to Present at Barclays CEO Energy-Power Conference August 27th, 2014

Nanotech Security Corp. to Acquire Fortress Optical Features Ltd., a Leading Producer of Banknote Security Features August 27th, 2014

Imaging

JPK expands availability of instrumentation in the USA – appointing new distributors – launched a new web site to support the US market - AFM now available to US users August 26th, 2014

Scientists craft atomically seamless, thinnest-possible semiconductor junctions August 26th, 2014

X-ray Laser Probes Tiny Quantum Tornadoes in Superfluid Droplets: SLAC Experiment Reveals Mysterious Order in Liquid Helium August 25th, 2014

Biomimetic photodetector 'sees' in color: Rice lab uses CMOS-compatible aluminum for on-chip color detection August 25th, 2014

Announcements

Nanodiamonds Are Forever: A UCSB professor’s research examines 13,000-year-old nanodiamonds from multiple locations across three continents August 27th, 2014

Aspen Aerogels, Inc. to Present at Barclays CEO Energy-Power Conference August 27th, 2014

Nanotech Security Corp. to Acquire Fortress Optical Features Ltd., a Leading Producer of Banknote Security Features August 27th, 2014

Malvern specialists to deliver inaugural short course on polymer characterization at Interplas 2014 August 27th, 2014

Interviews/Book Reviews/Essays/Reports/Podcasts/Journals

The thunder god vine, assisted by nanotechnology, could shake up future cancer treatment: Targeted therapy for hepatocellular carcinoma using nanotechnology August 27th, 2014

Scientists craft atomically seamless, thinnest-possible semiconductor junctions August 26th, 2014

Competition for Graphene: Berkeley Lab Researchers Demonstrate Ultrafast Charge Transfer in New Family of 2D Semiconductors August 26th, 2014

Symphony of nanoplasmonic and optical resonators leads to magnificent laser-like light emission August 26th, 2014

Tools

Malvern specialists to deliver inaugural short course on polymer characterization at Interplas 2014 August 27th, 2014

JPK expands availability of instrumentation in the USA – appointing new distributors – launched a new web site to support the US market - AFM now available to US users August 26th, 2014

Scientists craft atomically seamless, thinnest-possible semiconductor junctions August 26th, 2014

RMIT delivers $30m boost to micro and nano-tech August 26th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE