- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
A recent publication in Spectroscopy Europe by lead authors from Kimberly Clark Corporation showed the use of AFM based nanoscale IR Spectroscopy for reverse engineering of polymeric multilayer films. The Atomic Force Microscope (AFM) is a fairly common nanoscale characterization technique but its main drawback to date was its inability to provide chemical composition information from a sample. By combining the AFM with a tunable Infrared (IR) source, IR spectra with nanoscale spatial resolution can be collected. As film thicknesses in multilayer films continue to shrink, AFM-IR provides an important capability for sample analysis.
According to the lead author, Tom Eby of Kimberly Clark Corporation, "‘Reverse engineering based on IR is an important application in most industrial labs and the spatial resolution breakthrough of the AFM-IR technique now enables this for a wide range of materials with sub-micron features.''
The paper titled " Reverse engineering of polymeric multilayers using AFM-based nanoscale IR spectroscopy and thermal analysis " was published in the June issue of Spectroscopy Europe. The authors used a combination of AFM-IR and nanoscale thermal analysis to obtain both infrared spectra and transition temperatures of each layer in a cross-sectioned multilayer film. From the combination of the two measurement techniques they were able to identify the six layers which included composite thin films.
About Anasys Instruments
Anasys Instruments is dedicated to delivering innovative products that measure material properties for samples with spatially varying physical and chemical properties at the nanoscale. Anasys introduced the nano-TA in 2006 which pioneered the field of nanoscale thermal property measurement. In 2010, Anasys introduced the award-winning breakthrough nanoIR™ Platform which pioneered the field of nanoscale IR measurement. Now in 2012, Anasys is proud to introduce the breakthrough Lorentz Force Contact Resonance, which pioneers the field of wideband nanomechanical spectroscopy.
For more information, please click here
Anasys Instruments Corporation
121 Gray Avenue, Suite 100
CA 93101 USA
Tel: +1 (805) 730-3310
Talking Science Limited
39 de Bohun Court
Essex CB10 2BA, UK
Tel: +44 (0) 1799 521881
Mob: +44 (0) 7843 012997
Copyright © Anasys InstrumentsIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
Novel capping strategy improves stability of perovskite nanocrystals: Study addresses instability issues with organometal-halide perovskites, a promising class of materials for solar cells, LEDs, and other applications June 13th, 2016
Soft decoupling of organic molecules on metal June 23rd, 2016
FEI Launches Helios G4 DualBeam Series for Materials Science: The Helios G4 DualBeam Series features new capabilities to enable scientists and engineers to answer the most demanding and challenging scientific questions June 27th, 2016