Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Hitachi Launches World’s Highest Resolution FE-SEM

Abstract:
The new SU9000 Field Emission (FE) Scanning Electron Microscope (SEM) from Hitachi High-Technologies features novel electron optics which allow 0.4 nm resolution to be achieved at an accelerating voltage of 30 kV, with a usable magnification up to 3 Million times. This is believed to be the highest resolution-performance currently achievable on a commercially available instrument.

Hitachi Launches World’s Highest Resolution FE-SEM

Maidenhead, UK | Posted on May 31st, 2011

Featuring a new type of cold FE electron source with excellent stability and brightness and utilising Hitachi's 25 year experience of in-lens detection technology, the SU9000 also provides outstanding ultra-low current and low voltage imaging of sensitive materials. This excellent all-round performance, combined with fast specimen exchange times and the optional scanning transmission (STEM) modes, makes the SU9000 the ideal choice for use in applications ranging from semiconductor devices, electronics, and advanced nanotechnology materials, to life sciences and medicine.

The new, cold FE electron source delivers probe current that is approximately double that of earlier models, giving high quality images with superior S/N and exceptional stability from the moment the electron beam is switched on. The high performance electron optics allow a resolution of 1.2 nm at an accelerating voltage of 1 kV to be achieved without the need for beam deceleration technology. This greatly simplifies low energy imaging and significantly increases sample throughput.

Hitachi's unique dual through-the-lens detection system allows filtering of electrons of different energies, to give the capability for simultaneous multi-signal imaging. This provides extraordinary versatility for the imaging of structures and surface properties.

Using the scanning transmission (STEM) option, the SU9000 guarantees STEM resolution that can allow the lattice structure of graphite (C (002) d=0.34 nm) to be imaged at 30 kV accelerating voltage. The unique STEM detection system allows simultaneous bright field and dark field imaging and annular DF detection with selectable scattering angle. Up to 4 signals can be simultaneously displayed.

The SU9000 features side-entry sample insertion and can be ready for high resolution imaging in as little as 6 minutes or less; the fast exchange times benefiting from the high stability of the electron beam.

An order of magnitude better vacuum around the sample minimizes contamination, enhancing resolution and eliminating the need for an additional cold trap for cryo work on biological samples.

Ease of use is guaranteed through a new user interface, while a large 24.1-inch widescreen monitor offers a comfortable environment for both operating the instrument and viewing images.

####

For more information, please click here

Contacts:
Press Enquiries:
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Tel: +44 (0)1763 262621

Internet: www.inpress.co.uk

Other Enquiries:
Hitachi High-Technologies Corporation
Whitebrook Park, Lower Cookham Road
Maidenhead, Berkshire SL6 8YA
Tel: + 44 (0) 800 316 1500

Copyright © Hitachi High-Technologies Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Canatu Launches CNB In-Mold Film for Transparent Touch on 3D Surfaces –in Cars, Household Appliances, Wearables, Portables November 20th, 2014

Imaging

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Announcements

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Nano Sorbents Able to Remove Pollutions Caused by Oil Derivatives November 20th, 2014

Tools

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE