Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > NIST, AIP to Make Semiconductor Research Freely Available Online

Proceedings that have been available through paid subscription or compendium volumes, such as this one from the conference's first year, are now available online at no charge.
Credit: AIP
Proceedings that have been available through paid subscription or compendium volumes, such as this one from the conference's first year, are now available online at no charge.
Credit: AIP

Abstract:
A wealth of information on recent advances in semiconductor research is now available for free, thanks to an agreement between the National Institute of Standards and Technology (NIST) and the American Institute of Physics (AIP). The development should be welcome news to semiconductor chip manufacturers, universities and others in the computer industry who will find it less expensive to explore changes in critical measurements for semiconductor technology.

NIST, AIP to Make Semiconductor Research Freely Available Online

Gaithersburg, MD | Posted on May 25th, 2011

The two institutions have made the proceedings from the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly Characterization and Metrology for ULSI Technology) available for free download from both their Web sites. Until now, papers presented at the NIST-led conference series, which began in 1995, were only available through paid subscriptions.

NIST's David Seiler says the proceedings' availability should greatly help employees in the fast-paced semiconductor industry get up to speed on unfamiliar measurement and characterization issues. In addition, they can learn about new techniques and equipment being introduced to characterize semiconductors.

"These collected proceedings represent research and overviews of critical topics collected from worldwide experts in the field of semiconductor characterization and metrology," says Seiler. "As there is frequent turnover in the industry, there is constant need for training and retraining of employees. Improved access to this background will ease that process dramatically."

On the NIST Web site, the archived proceedings publications, up to and including the 2009 conference (along with slides from most of the conference invited talks), are available at www.nist.gov/pml/semiconductor/conference/archives.cfm. The AIP has made the archived proceedings publications available at proceedings.aip.org/semiconductor_metrology. Documents are available in searchable PDF form.

The eighth conference in the series is being held this week (May 23-26, 2011) at the MINATEC Campus in Grenoble, France. Proceedings from this week's conference will be available online in the near future. Information about AIP is available at www.aip.org/aip.

####

About NIST
The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

For more information, please click here

Contacts:
Chad Boutin
(301) 975-4261

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Entanglement on a chip: Breakthrough promises secure communications and faster computers January 27th, 2015

Nanoshuttle wear and tear: It's the mileage, not the age January 26th, 2015

Detection of Heavy Metals in Samples with Naked Eye January 26th, 2015

Engineering self-assembling amyloid fibers January 26th, 2015

Laboratories

Nanoshuttle wear and tear: It's the mileage, not the age January 26th, 2015

Chip Technology

Entanglement on a chip: Breakthrough promises secure communications and faster computers January 27th, 2015

Electronic circuits with reconfigurable pathways closer to reality January 26th, 2015

The latest fashion: Graphene edges can be tailor-made: Rice University theory shows it should be possible to tune material's properties January 24th, 2015

New method to generate arbitrary optical pulses January 21st, 2015

Announcements

Entanglement on a chip: Breakthrough promises secure communications and faster computers January 27th, 2015

Iranian Researchers Boost Solar Cells Efficiency Using Anti-Aggregates January 26th, 2015

Detection of Heavy Metals in Samples with Naked Eye January 26th, 2015

Engineering self-assembling amyloid fibers January 26th, 2015

Events/Classes

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

PEN Inc. New Product Development Highlighted for Emerging Nanotechnology Enterprises: Scott Rickert, PEN Chairman, Addresses Webinar for National Nanotechnology Coordination Office January 22nd, 2015

Teijin to Participate in Nano Tech 2015 January 22nd, 2015

Alliances/Partnerships/Distributorships

Entanglement on a chip: Breakthrough promises secure communications and faster computers January 27th, 2015

Smart keyboard cleans and powers itself -- and can tell who you are January 21st, 2015

DNA 'glue' could someday be used to build tissues, organs January 14th, 2015

GLOBALFOUNDRIES and Linear Dimensions to Offer Joint Analog Solution For Fast-Growing Wearables and MEMs Sensors Markets January 9th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE