Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > NIST, AIP to Make Semiconductor Research Freely Available Online

Proceedings that have been available through paid subscription or compendium volumes, such as this one from the conference's first year, are now available online at no charge.
Credit: AIP
Proceedings that have been available through paid subscription or compendium volumes, such as this one from the conference's first year, are now available online at no charge.
Credit: AIP

Abstract:
A wealth of information on recent advances in semiconductor research is now available for free, thanks to an agreement between the National Institute of Standards and Technology (NIST) and the American Institute of Physics (AIP). The development should be welcome news to semiconductor chip manufacturers, universities and others in the computer industry who will find it less expensive to explore changes in critical measurements for semiconductor technology.

NIST, AIP to Make Semiconductor Research Freely Available Online

Gaithersburg, MD | Posted on May 25th, 2011

The two institutions have made the proceedings from the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly Characterization and Metrology for ULSI Technology) available for free download from both their Web sites. Until now, papers presented at the NIST-led conference series, which began in 1995, were only available through paid subscriptions.

NIST's David Seiler says the proceedings' availability should greatly help employees in the fast-paced semiconductor industry get up to speed on unfamiliar measurement and characterization issues. In addition, they can learn about new techniques and equipment being introduced to characterize semiconductors.

"These collected proceedings represent research and overviews of critical topics collected from worldwide experts in the field of semiconductor characterization and metrology," says Seiler. "As there is frequent turnover in the industry, there is constant need for training and retraining of employees. Improved access to this background will ease that process dramatically."

On the NIST Web site, the archived proceedings publications, up to and including the 2009 conference (along with slides from most of the conference invited talks), are available at www.nist.gov/pml/semiconductor/conference/archives.cfm. The AIP has made the archived proceedings publications available at proceedings.aip.org/semiconductor_metrology. Documents are available in searchable PDF form.

The eighth conference in the series is being held this week (May 23-26, 2011) at the MINATEC Campus in Grenoble, France. Proceedings from this week's conference will be available online in the near future. Information about AIP is available at www.aip.org/aip.

####

About NIST
The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

For more information, please click here

Contacts:
Chad Boutin
(301) 975-4261

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Laboratories

Lawrence Livermore researchers develop efficient method to produce nanoporous metals November 25th, 2014

News and information

Renishaw receives Queen's Award for spectroscopy developments November 25th, 2014

JPK reports on the use of AFM and the CellHesion module to study plant cells at the University of Queensland November 25th, 2014

Vegetable oil ingredient key to destroying gastric disease bacteria: In mice, therapeutic nanoparticles dampen H. pylori bacteria and inflammation that lead to ulcers and gastric cancer November 25th, 2014

Research yields material made of single-atom layers that snap together like Legos November 25th, 2014

Chip Technology

Nanometrics Announces Upcoming Investor Events November 19th, 2014

A novel method for identifying the body’s ‘noisiest’ networks November 19th, 2014

Researchers create & control spin waves, lifting prospects for enhanced info processing November 17th, 2014

VDMA Electronics Production Equipment: Growth track for 2014 and 2015 confirmed: Business climate survey shows robust industry sector November 14th, 2014

Announcements

Renishaw receives Queen's Award for spectroscopy developments November 25th, 2014

JPK reports on the use of AFM and the CellHesion module to study plant cells at the University of Queensland November 25th, 2014

Vegetable oil ingredient key to destroying gastric disease bacteria: In mice, therapeutic nanoparticles dampen H. pylori bacteria and inflammation that lead to ulcers and gastric cancer November 25th, 2014

Research yields material made of single-atom layers that snap together like Legos November 25th, 2014

Events/Classes

Professional AFM Images with a Three Step Click SmartScan by Park Systems Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process November 24th, 2014

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

Sustainable Nanotechnologies Project November 20th, 2014

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Alliances/Partnerships/Distributorships

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

UO-industry collaboration points to improved nanomaterials: University of Oregon microscope puts spotlight on the surface structure of quantum dots for designing new solar devices November 20th, 2014

A novel method for identifying the body’s ‘noisiest’ networks November 19th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE