- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
The new SPECORD® PLUS from Analytik Jena UK is ideally suited to materials and solid sample analysis.
Featuring a large sample compartment, this new UV/Vis spectrophotometer is characterized by outstanding performance combined with a comprehensive range of built-in analysis methods for simple but highly accurate analysis. The instrument can be configured to determine optical properties such as transmittance, reflectance, color, haze or luminance of solid materials. This is of particular interest in the paper and textiles industries as well as optical and plastic industries, colour industries and many more.
The diffuse reflectance accessory with integrating sphere can be used for the measurement of transmittance and diffuse reflectance of scattering solid or liquid samples as well as powdery samples. Using built-in colour software the different colour coordinates can be calculated, or for textiles or the white and yellow indices can be determined to ASTM E 313-67 and DIN 6167.
Transmission characteristics of different materials such as glasses and foils can be measured using the solid sample the holder. This scanning attachment simplifies the precise determination of properties such as the structure or quality of coatings for large surfaces. The determination of the refractive index and the film thickness of these materials can be carried out using the variable angle reflectance attachment. An autosampler with up to 116 sample positions is ideal for routine analysis with a high sample throughput.
The SPECORD® PLUS benefits from a wavelength range of 190-1100 nm, high performance optics and outstanding long-term stability due to Cooled Double Detection, all boosted by a 10-year long-term warranty. A special validation software module checks that all important spectrophotometer operating parameters are in compliance with internal or external quality standards to ensure that measurement results conform to the highest standards of reliability, accuracy and precision. The Instrument is also supplied with IQ/OQ documents.
For more information, please click here
Press Enquiries: In Press PR Ltd,
PO Box 24, Royston, Herts, SG8 6TT Tel: +44 (0)1763 262621
Other Enquiries: Vince Phelan, Analytik Jena UK, PO Box 932, Wembley, HA0 9EH, UK
Tel: +44 (0)208 429 7466, Fax: +44 (0)208 429 7539
Copyright © Analytik Jena UKIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
National Science Foundation Selects SUNY Poly CNSE for Expanded $2.1M Northeast Advanced Technological Education Center: NSF Center Locates to NanoCollege in Support of Flourishing Tech Industry in NYS September 1st, 2015
Using DNA origami to build nanodevices of the future September 1st, 2015
Nanotech could rid cattle of ticks, with less collateral damage September 1st, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015
Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015