Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > News > Nanopositioning Stages suit super-resolution microscopy

November 23rd, 2009

Nanopositioning Stages suit super-resolution microscopy

Abstract:
Designed for Leica, Nikon, Olympus, and Zeiss inverted microscopes, PI nano1x3(TM) series XY and XYZ nanopositioning stages offer subnanometer resolution over travel ranges of 200 Ám. Featuring 20 mm profile, they include 24-bit controller with USB, Ethernet, and RS-232 interfaces and wide-band analog interface. Units also have 24-bit DAC converters, in addition to piezoresistive sensors applied directly to moving structure to accurately measure displacement of platform.

Source:
thomasnet.com

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Newly-Developed Nanobiosensor Quickly Diagnoses Cancer August 20th, 2014

Ultrasonic Waves Applied in Production of Graphene Nanosheets August 20th, 2014

The channel that relaxes DNA: Relaxing DNA strands by using nano-channels: Instructions for use August 20th, 2014

Success in Intracellular Imaging of Cesium Distribution in Plants Used for Cesium Absorption August 19th, 2014

Announcements

Newly-Developed Nanobiosensor Quickly Diagnoses Cancer August 20th, 2014

Ultrasonic Waves Applied in Production of Graphene Nanosheets August 20th, 2014

The channel that relaxes DNA: Relaxing DNA strands by using nano-channels: Instructions for use August 20th, 2014

Electrical engineers take major step toward photonic circuits: Team invents non-metallic metamaterial that enables them to 'compress' and contain light August 19th, 2014

Tools

Oxford Instruments Asylum Research Receives the 2014 Microscopy Today Innovation Award for blueDrive Photothermal Excitation August 18th, 2014

Laser makes microscopes way cooler: Cooling a nanowire probe with a laser could lead to substantial improvements in the sensitivity of atomic force probe microscopes August 15th, 2014

JPK reports on the use of AFM and advanced fluorescence microscopy at the University of Freiburg August 13th, 2014

Phasefocus reports on the use of their high-precision Lens Profiler for measuring contact lens thickness at the Brien Holden Vision Institute in Sydney, Australia August 13th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE