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Home > Press > Tool Order: MultiProbe Ships Six-Head Atomic Force Proper (AFP)

Key company purchases Atomic Force Prober (AFP) to help solve FA issues at lower technology nodes. Failure analysts support the choice of the AFP over other tools, given new challenges arising from shrinking technology.

Tool Order: MultiProbe Ships Six-Head Atomic Force Proper (AFP)

Santa Barbara, CA | Posted on October 8th, 2009

After a thorough evaluation of competitive tools, a major microelectronics company has selected the MultiProbe AFP to help it stay competitive in an industry whose key players are jockeying for the lead in delivering smaller, faster devices.

"I would say that the AFP technique in most cases, is the determinant technique [for identifying root cause], especially regarding lower technologies, below 45nm," says one global competitor.

"The AFP has definitely added a capability that did not exist before. Optical limitations make traditional electrical probing a thing of the past, as features can no longer be resolved; and chamber FIB/SEM probing leads to sample damage and inaccurate results as well as tying up a tool," says another.

The MultiProbe AFP offers both nanoprobing and simultaneous fault isolation imaging in a single tool (topography, current imaging and scanning capacitance).
About MultiProbe™

ISO 9001:2008 certified: MultiProbe™ is the developer and manufacturer of the Atomic Force Prober (AFP), the industry's highest resolution nanoprober. As such, the company is committed to satisfying customer expectations and continually improving technology, processes and customer service. MultiProbe AFPs are installed worldwide, providing electrical measurements of the smallest semiconductor devices, improving yield and accelerating the development of processes as low as 22nm. MultiProbe is located in Santa Barbara, Calif., USA.

Information about MultiProbe is available on the Web at


About MultiProbe
MultiProbe™, is the developer and manufacturer of the Atomic Force nano Prober (AFP): a tool designed for semiconductor failure analysis and R&D and used by companies that manufacture, support or rely on electronics for use in their products.

The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced circuitry: a method of measuring devices and identifying failures that would otherwise be invisible to even the most sophisticated optical microscopes.

Founded in 2001 by Andrew N. Erickson, President and CEO, MultiProbe™, is an ISO 9001:2008 certified company that owes its success to an ongoing commitment to improve technology, processes and customer service. Current clients include leading companies from around the world that strive for faster, smaller technologies to anticipate and fulfill consumer demand.

For more information, please click here

Susie Mauceri

Copyright © MultiProbe

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