Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Agilent News: Enhanced Performance of Popular Atomic Force Microscope for Research, Education

Abstract:
TRADE NEWS: Agilent Technologies Enhances Performance of Popular Atomic Force Microscope for Research, Education

Agilent News: Enhanced Performance of Popular Atomic Force Microscope for Research, Education

SANTA CLARA, CA | Posted on April 16th, 2009

Agilent Technologies Inc. (NYSE: A) today announced the availability of a next-generation atomic force microscope (AFM) that can excel in both the laboratory and the classroom. The new Agilent 5420 AFM based on Agilent's popular 5400 platform, is a high-precision instrument that has been re-engineered to deliver lower noise, better performance and greater versatility.

"A new ergonomic design, lower-noise electronics and improved visual optics are among the key features that make the 5420 a powerful, easy-to-use tool for a wide range of materials science, polymers, electrical characterization and general surface characterization applications," said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Ariz. "This scientific-grade AFM delivers atomic-scale resolution at a very competitive price, as well as providing a simple upgrade path."

The Agilent 5420 offers educators an exceptional opportunity to introduce their students to many useful AFM techniques; the microscope will be delivered with an undergraduate course curriculum and samples for teaching labs. Several performance-enhancing options are available for the 5420, including an open-loop and closed-loop X-Y & Z 90 micron scanner, a 9 micron open-loop scanner, and a 10 micron STM scanner, each engineered to provide optimum control over probe position.

For high-resolution imaging in liquid, Agilent's patented MAC Mode is available. Precision thermal control can be added as well. The Agilent 5420 is also compatible with MAC Mode III, which provides three user-configurable lock-in amplifiers to afford virtually limitless application possibilities, unprecedented speed and the ability to use higher resonance modes of the cantilever.

Another option for the 5420 is electrical single-pass microscopy mode, a new low-noise technique that enables high-resolution KFM/EFM and PFM. This mode allows users to customize signal routing between the MAC Mode III lock-in amplifiers, providing more advanced multifrequency scanning.

The 5420 is also compatible with Agilent's unique scanning microwave microscopy (SMM) mode, which combines the compound, calibrated electrical measurement capabilities of a microwave vector network analyzer with the nanoscale spatial resolution of an atomic force microscope. SMM Mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering greater application versatility, the ability to acquire quantitative results, and the highest sensitivity and dynamic range in the industry.

Agilent's new 5420 AFM features the same state-of-the-art scanners, controller and software used by Agilent's entire line of field-proven atomic force microscopes. Popular Agilent AFM systems include the sophisticated Agilent 5500, which offers industry-leading environmental control, as well as the versatile Agilent 5600LS, which enables AFM imaging of both large and small samples on a fully addressable, highly programmable 200mm stage.

AFM Instrumentation from Agilent Technologies

Agilent offers high-precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use AFM technologies.

####

About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company's 19,000 employees serve customers in more than 110 countries. Agilent had net revenues of $5.8 billion in fiscal 2008.

For more information, please click here

Contacts:
Joan Horwitz
+1 480 756 5905


Janet Smith
+1 970 679 5397

Copyright © Agilent Technologies Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

A new, tunable device for spintronics: An international team of scientists including physicist Jairo Sinova from the University of Mainz realises a tunable spin-charge converter made of GaAs August 29th, 2014

Nanoscale assembly line August 29th, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Copper shines as flexible conductor August 29th, 2014

Imaging

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

Ultra-Low Frequency Vibration Isolation Stabilizes Scanning Tunneling Microscopy at UCLA’s Nano-Research Group August 28th, 2014

Academic/Education

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

RMIT delivers $30m boost to micro and nano-tech August 26th, 2014

SEMATECH and Newly Merged SUNY CNSE/SUNYIT Launch New Patterning Center to Further Advance Materials Development: Center to Provide Access to Critical Tools that Support Semiconductor Technology Node Development August 7th, 2014

Oxford Instruments Asylum Research and the Center for Nanoscale Systems at Harvard University Present a Workshop on AFM Nanomechanical and Nanoelectrical Characterization, Aug. 21-22 August 6th, 2014

Announcements

A new, tunable device for spintronics: An international team of scientists including physicist Jairo Sinova from the University of Mainz realises a tunable spin-charge converter made of GaAs August 29th, 2014

Nanoscale assembly line August 29th, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Tools

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

Ultra-Low Frequency Vibration Isolation Stabilizes Scanning Tunneling Microscopy at UCLA’s Nano-Research Group August 28th, 2014

Measure Both Elastic and Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode August 28th, 2014

Malvern specialists to deliver inaugural short course on polymer characterization at Interplas 2014 August 27th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE