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In the framework of its total quality policy, NANOLANE has joined as French member the international experts group WG1PG8 ‘Terminology for nanoscale measurement and instrumentation' headed by Dr John Miles (National Measurement Institute, Australia).
The purpose of this Project Group is to provide stakeholders, including manufacturers, researchers, technologists, patent agents, regulators, etc., with a comprehensive list of terms and definitions relevant to measurement and instrumentation for use at the nanoscale. The future technical specification will be applicable but not limited to terms used in the measurement of chemical, functional and structural properties at the nanoscale.
Nanolane is also present in the Work Group 1 (‘Terminology, classification and nomenclature') of the French ISO Commission working on the first ISO and CEN standards in the Nanotechnology area. The French commission is leaded by the Agence Francaise de NORmalisation (www.afnor.com) and is the mirror structure of the nanotechnology technical committee (TC 229) of the International Standardization Organization (www.iso.org).
About ISO TC 229 commission:
ISO TC 229 commission was formed in mid-2005 to progress standardization in the field of nanotechnology. Specific tasks to be undertaken by ISO/TC 229 include developing standards for:
WG1 : Terminology, classification and nomenclature
WG2 : Measurement and characterization
WG3 : Health, safety and environmental issues
WG4 : Materials specifications
The scope of the commission is the standardization in the field of nanotechnologiesthat includes either or both of the following:
1. Understanding and control of matter and processes at the nanoscale, typically, but not exclusively, below 100 nanometres in one or more dimensions where the onset of size-dependent phenomena usually enables novel applications.
2. Utilizing the properties of nanoscale materials that differ from the properties of individual atoms, molecules, and bulk matter, to create improved materials, devices, and systems that exploit these new properties.
Nanolane is specialized in optical solutions at nanoscale and commercializes an innovative quantitative technique called Sarfus which extends the analysis possibilities in the fields of nanotechnologies.
Nanolane develops and offers new optical and software solutions for: Visualization or detection of nano-objects and ultra thin films / Thickness measurement of ultra thin films (repeatability less than 0.3nm).
Our tools offers many benefits: simplicity of use, extreme sensitivity, no scanning needed, real-time visualization, 3D representation, large observation area (up to mm), lateral resolution of optical microscopy.
Our ability to design and manufacture high quality visualization and metrology tools for nanotechnology is our company's key assets.
For more information, please click here
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