Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Filmetrics Launches Thin-film Photovoltaic Dedicated Metrology Systems

F10-PV and F37-PV are commercially available thin-film metrology solutions capable of measuring all classes of films used in today's TFPV industry
F10-PV and F37-PV are commercially available thin-film metrology solutions capable of measuring all classes of films used in today's TFPV industry

Abstract:
High-speed, reliable, and affordable metrology solutions for every class of thin-film photovoltaic material used in today's industry

Filmetrics Launches Thin-film Photovoltaic Dedicated Metrology Systems

San Diego, CA | Posted on March 19th, 2009

Filmetrics announces the launch of its thin-film photovoltaic (TFPV) dedicated measurement systems. With the release of the F10-PV and the F37-PV Filmetrics now offers commercially available tabletop and in-line metrology solutions for industries utilizing all classes of TFPV materials. Typically built on or under transparent conductive oxides (TCO) on glass, plastics, or metal substrates, the properties of TFPV films are notoriously difficult to measure due to their special optical properties. Filmetrics has SOLVED this problem for all classes of films used in today's industry.

The Filmetrics F10-PV and F37-PV products are capable of monitoring the film thickness of active layers such as amorphous Si, CdS, CdTe, copper-indium gallium diselenide (CIGS), TCOs, and buffer layers. These types of devices are intentionally designed to absorb rather than reflect light creating many unique challenges for performing metrology on these layers. Surmounting these challenges the F10-PV and the F37-PV can accurately measure the thickness and optical properties of even the most complex structures on TCOs adding unrivalled value in terms of production quality, efficiency, and cost control for TFPV device manufacturers.

Strong market demand, and working closely with our existing TFPV customer base, led Filmetrics to undergo extensive collaborative research in the past months to develop these products. The addition of non-destructive thin-film thickness metrology to the TFPV environment is expected to greatly enhance production efficiency and yields, help develop new processes, and facilitate rapid transfer these new ideas to the production floor.

With years of experience in the thin-film measurement field, Filmetrics provides a simple-to-understand user interface and unparalleled support. Headquartered in San Diego, CA, Filmetrics has a full line of thin-film measurement systems and is continually developing new products and technologies that bring greater efficiency to thin-film metrology. Filmetrics was founded in 1995 and has quickly established itself as the foremost innovator in the thin-film measurement industry.

####

About Filmetrics
Filmetrics, Inc. was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, commercial thin-film measurement instruments cost $50,000 or more and required operators to have advanced training. Single measurements took several minutes, even hours.

The Filmetrics approach was to design an affordable purpose-built miniature spectrometer system, whose low cost had just recently been made possible by advances in silicon detector array technology. We combined this with sophisticated software that integrated advanced thin-film expertise into a simple, intuitive Windows interface. The result was the F20, a compact system with astounding speed and accuracy, which line operators could be trained to use in a matter of minutes - all at a mere fraction of the cost of traditional instruments.

Our accomplishments have been widely recognized by the industry press, including recognition as one of the "100 Most Technologically Significant" products of the year and one of the "25 Best New Products" of the year.

Contacts:
Scott Chalmers
Filmetrics
(858) 573-9300

Copyright © Filmetrics

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related Links

Filmetrics

Related News Press

News and information

Seeing quantum motion August 30th, 2015

Artificial leaf harnesses sunlight for efficient fuel production August 30th, 2015

Researchers use DNA 'clews' to shuttle CRISPR-Cas9 gene-editing tool into cells August 30th, 2015

Draw out of the predicted interatomic force August 30th, 2015

Thin films

Electrospray solves longstanding problem in Langmuir-Blodgett assembly: The electrospray spreads water-soluble solvents on water while minimizing mixing August 20th, 2015

Scientists achieve major breakthrough in thin-film magnetism August 17th, 2015

Rice, Penn State open center for 2-D coatings: National Science Foundation selects universities to develop atom-thin materials with industry partners August 13th, 2015

Thin films offer promise for ferroelectric devices: Researchers at Tokyo Institute of Technology demystify the ferroelectric properties observed in hafnium-oxide-based thin films, revealing a potentially useful device material August 3rd, 2015

Products

Nanofilm Introduces Clarity AR Lens Cleaner for Anti-Reflective Superhydrophobic Lenses August 20th, 2015

Pixelligent Launches New PixClear® Light Extraction Materials for OLED Lighting August 4th, 2015

Aculon Launches NanoProof Series for PCB Waterproofing July 20th, 2015

Philips Introduces Quantum Dot TV with Color IQ™ Technology from QD Vision: Manufacturer is first to offer quantum dot displays for both TVs and monitors June 30th, 2015

Announcements

Seeing quantum motion August 30th, 2015

Artificial leaf harnesses sunlight for efficient fuel production August 30th, 2015

Researchers use DNA 'clews' to shuttle CRISPR-Cas9 gene-editing tool into cells August 30th, 2015

Draw out of the predicted interatomic force August 30th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic