- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
|F10-PV and F37-PV are commercially available thin-film metrology solutions capable of measuring all classes of films used in today's TFPV industry|
High-speed, reliable, and affordable metrology solutions for every class of thin-film photovoltaic material used in today's industry
Filmetrics announces the launch of its thin-film photovoltaic (TFPV) dedicated measurement systems. With the release of the F10-PV and the F37-PV Filmetrics now offers commercially available tabletop and in-line metrology solutions for industries utilizing all classes of TFPV materials. Typically built on or under transparent conductive oxides (TCO) on glass, plastics, or metal substrates, the properties of TFPV films are notoriously difficult to measure due to their special optical properties. Filmetrics has SOLVED this problem for all classes of films used in today's industry.
The Filmetrics F10-PV and F37-PV products are capable of monitoring the film thickness of active layers such as amorphous Si, CdS, CdTe, copper-indium gallium diselenide (CIGS), TCOs, and buffer layers. These types of devices are intentionally designed to absorb rather than reflect light creating many unique challenges for performing metrology on these layers. Surmounting these challenges the F10-PV and the F37-PV can accurately measure the thickness and optical properties of even the most complex structures on TCOs adding unrivalled value in terms of production quality, efficiency, and cost control for TFPV device manufacturers.
Strong market demand, and working closely with our existing TFPV customer base, led Filmetrics to undergo extensive collaborative research in the past months to develop these products. The addition of non-destructive thin-film thickness metrology to the TFPV environment is expected to greatly enhance production efficiency and yields, help develop new processes, and facilitate rapid transfer these new ideas to the production floor.
With years of experience in the thin-film measurement field, Filmetrics provides a simple-to-understand user interface and unparalleled support. Headquartered in San Diego, CA, Filmetrics has a full line of thin-film measurement systems and is continually developing new products and technologies that bring greater efficiency to thin-film metrology. Filmetrics was founded in 1995 and has quickly established itself as the foremost innovator in the thin-film measurement industry.
Filmetrics, Inc. was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, commercial thin-film measurement instruments cost $50,000 or more and required operators to have advanced training. Single measurements took several minutes, even hours.
The Filmetrics approach was to design an affordable purpose-built miniature spectrometer system, whose low cost had just recently been made possible by advances in silicon detector array technology. We combined this with sophisticated software that integrated advanced thin-film expertise into a simple, intuitive Windows interface. The result was the F20, a compact system with astounding speed and accuracy, which line operators could be trained to use in a matter of minutes - all at a mere fraction of the cost of traditional instruments.
Our accomplishments have been widely recognized by the industry press, including recognition as one of the "100 Most Technologically Significant" products of the year and one of the "25 Best New Products" of the year.
Copyright © FilmetricsIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
Nanospiked bacteria are the brightest hard X-ray emitters July 2nd, 2015
Dais Analytic Unveils New Version of Aqualyte Membrane Technology: Updates to the Basis of the Company's Industry-Changing Nanotechnology Designed to Strengthen Position in Global Air, Energy, and Water Markets June 26th, 2015