Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Abstract:
The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope.

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Peabody, MA | Posted on March 10th, 2009

According to JEOL USA, the company's U.S. subsidiary, JEOL has unveiled its new JEM-ARM200F atomic resolution analytical microscope, setting a new benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class. Through a rigorous development and design program inspired by JEOL customers, the JEOL team has produced an entirely new platform of TEM that achieves a guaranteed HAADF-STEM (high angle annular dark field) resolution of 80 picometers, or 0.08 nanometers.

Enhanced Analytical S/TEM

With advanced analytical capabilities, the JEM-ARM200F enables both atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis.

Ultimate Stability at the Sub-Nanometer Scale

The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale. The electron column is isolated from the environmental disturbances found in most labs. A superior shielding design safeguards the ultrahigh-powered optics from airflow, vibration, and acoustical interference. Additional shielding ensures protection from electronic interference, magnetic fields, and thermal fluctuations.

Integrated Software Automation

The latest in software automation has been designed into the new ARM200F, with tomography and holography simplified by a user-friendly GUI.

First U.S. Installation in World-renowned Researcher's Lab

The University of Texas at San Antonio (UTSA) will be the site of the first installation of the new JEM-ARM200F. The microscope will be housed in the Advanced Microscopy Laboratory under the supervision of world-renowned researcher Miguel Yacaman, chair of the College of Sciences' Department of Physics and Astronomy. There, it will support first-class research in nanotechnology, materials science, medicine, biology, chemistry and engineering.

Backed by Award-winning Service and Support

JEOL USA is renowned for its unrivaled applications expertise and training, plus its comprehensive, award-winning 24/7 service.

####

About JEOL USA
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information, please click here

Contacts:
JEOL USA, Inc.
11 Dearborn Road
Peabody, MA 01960
978-535-5900

Pamela Mansfield
Marketing Communications
JEOL USA
11 Dearborn Road
Peabody, MA 01966

Copyright © JEOL USA

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Sustainable Nanotechnologies Project November 20th, 2014

Quantum mechanical calculations reveal the hidden states of enzyme active sites November 20th, 2014

Imaging

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Announcements

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Silver Nanoparticles Produced in Iran from Forest Plants Extract November 20th, 2014

Nano Sorbents Able to Remove Pollutions Caused by Oil Derivatives November 20th, 2014

Tools

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE