Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Particle Measuring Systems Introduces the Nano-ID™ — a World-Class, Wide Range Sampling System for Occupational & Industrial Hygiene Air Monitoring

Abstract:
Selectively Sizes and Captures the Widest Range of Ultra-fine and Nanoparticles

Particle Measuring Systems Introduces the Nano-ID™ — a World-Class, Wide Range Sampling System for Occupational & Industrial Hygiene Air Monitoring

Boulder, CO | Posted on March 6th, 2009

Particle Measuring Systems announced this week the introduction of the Nano‑ID™, a world class particle sampling system providing the capability to selectively size and capture a wide range of ultra-fine and nanoparticles for occupational and industrial hygiene air monitoring.

The Nano-ID sorts and captures particles from 2 to 30,000 nanometers (30 microns) into 12 size bins, enabling each bin to be selectively analyzed for particle mass, size distribution, shape, composition, and morphology among other nanoparticle characteristics.

"No other particle sampler is able to cover such a wide particle size range in a compact and portable package," said Paul Kelly, President of Particle Measuring Systems, Inc. "We're excited that the Nano-ID fills a need for worker exposure evaluation, as well as air quality monitoring within the workplace environment. Ultimately, this allows companies to proactively manage and reduce worker health risks caused by ultra-fine and nanoparticles."

The Nano-ID is used for investigating particulate emissions and monitoring air quality for worker health risks associated with the manufacturing or use of nanomaterials, or processes that may unintentionally create nanoparticles, within production and research facilities. These nanoparticles can travel long distances and remain airborne for hours and days, highly increasing the odds of worker exposure and inhalation.

####

About Particle Measuring Systems
Particle Measuring Systems is the global leader in particle counting technology, with over 35 years of experience providing aerosol, liquid, and gas particle monitoring products for companies and organizations working with clean processes or in clean environments in order to protect critical products. As the inventors of laser-based particle counters, Particle Measuring Systems sets the standard for particle monitors in nanomaterial, pharmaceutical, aerospace, integrated circuit and electronics manufacturing.

For more information, please click here

Contacts:
Robin Kring
Marketing Communications Manager
(303) 443-7100, x267

Copyright © Particle Measuring Systems

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Researchers engineer improvements of technology used in digital memory November 24th, 2014

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Announcements

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

ASU, IBM move ultrafast, low-cost DNA sequencing technology a step closer to reality November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Tools

Iranian Experts Clean Uranium-Contaminated Water by Nano-Particles November 23rd, 2014

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Safety-Nanoparticles/Risk management

Sustainable Nanotechnologies Project November 20th, 2014

A gut reaction November 19th, 2014

Nanosafety research – there’s room for improvement October 29th, 2014

Plastic nanoparticles also harm freshwater organisms October 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE