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Home > News > Microscope takes nanoscale electromechanical measurements

December 6th, 2007

Microscope takes nanoscale electromechanical measurements

Abstract:
Atomic Force Microscope is available with Piezo Force Module, which enables crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. Through imaging modes, dual frequency resonance tracking, and band excitation, module effectively uses resonance enhancement in piezoresponse force microscopy (PFM) and provides information on local response and energy dissipation that cannot be obtained by standard AFM scanning modes.

Source:
news.thomasnet.com

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