Home > News > Microscope takes nanoscale electromechanical measurements
December 6th, 2007
Microscope takes nanoscale electromechanical measurements
Abstract:
Atomic Force Microscope is available with Piezo Force Module, which enables crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. Through imaging modes, dual frequency resonance tracking, and band excitation, module effectively uses resonance enhancement in piezoresponse force microscopy (PFM) and provides information on local response and energy dissipation that cannot be obtained by standard AFM scanning modes.
Source:
news.thomasnet.com
Bookmark:
Announcements
Nano-needles for cells May 25th, 2013
How do cold ions slide May 24th, 2013
Gold nanocrystal vibration captured on billion-frames-per-second film May 23rd, 2013
Glowing Plant Releases Maker Kit, Enabling Anyone to Make a Glowing Plant at Home: Glowing Plant seeks funds via crowdfunding and raises almost $400,000 May 23rd, 2013
Tools
Heinrich Rohrer dies at 79; a father of nanotechnology: With IBM colleague Gerd Binnig, Rohrer invented the scanning tunneling microscope, which can show individual atoms on a surface and move them around May 23rd, 2013
Gold nanocrystal vibration captured on billion-frames-per-second film May 23rd, 2013
Researchers Stitch Defects into the World’s Thinnest Semiconductor May 22nd, 2013
Whirlpools on the Nanoscale Could Multiply Magnetic Memory: At the Advanced Light Source, Berkeley Lab scientists join an international team to control spin orientation in magnetic nanodisks May 22nd, 2013