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Home > News > STMs get performance boost

November 23rd, 2007

STMs get performance boost

Abstract:
Scanning tunneling microscopes could be set for a major performance boost following the application of traditional reflectometry techniques to the quantum tunneling behaviour of electrons.

Research from a joint Cornell University/Boston University team found that, by positioning a needle like probe above the surface being inspected by the STM and passing radio waves though the device, they could detect changes in resistance at the junction between the two, when quantum tunneling occurred from one to the other.

Source:
newelectronics.co.uk

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