Nanotechnology Now

• About Us
  
  • Advertising
  • Our Mission
  • Our Team
  • Comments
  • Friends
  • Contact
• Nanotechnology
• News
  
  • Current News
  • Press Releases
  • Submit Press
  • Press kit
  • Interviews
• Columns
• Products
  
  • Our Products
  • Books
  • Featured Books
• Directories
  
  • Companies/Academic
  • Events
  • Glossary
  • Best Of
• Career Center
• Nano-Social Network
• Nano Consulting
• My Account

Home > News > Nanotech Needs Metrology to Achieve Full Potential

November 16th, 2007

Nanotech Needs Metrology to Achieve Full Potential

Abstract:
For nanotech to evolve from the laboratory and R&D arena, new ways must be devised to use traditional metrology platforms such as the SEM and atomic force microscopy (AFM), as well as new measurement technologies. This was the assessment of Darlene Solomon, CTO for Agilent Technologies (Santa Clara, Calif.), in her keynote presentation at the Nanocon International conference held in Santa Clara, Calif.

Quoting Rear Admiral Grace Murray Hopper's remark that "One accurate measurement is worth one thousand expert opinions," Solomon stated that since measurement is the cornerstone of scientific progress, it is therefore a primary driver in getting nanotech to reach its full potential. "As our ability to measure improves, we learn new things about how nature works. We then use what we learned to develop new technologies that, in turn, help us develop new measurements," she said.

Source:
semiconductor.net

Bookmark:

Related News Press

Announcements

JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013

Imec and GLOBALFOUNDRIES collaborate to advance high-density memory technology: STT-MRAM offers enhanced performance and scalability for embedded and standalone applications May 21st, 2013

International survey supports need for built-in water protection on smartphones and tablets May 21st, 2013

Rice unveils method for tailoring optical processors: Arranging nanoparticles in geometric patterns allows for control of light with light May 21st, 2013

Interviews/Book Reviews/Essays/Reports/Podcasts/Journals

International survey supports need for built-in water protection on smartphones and tablets May 21st, 2013

Rice unveils method for tailoring optical processors: Arranging nanoparticles in geometric patterns allows for control of light with light May 21st, 2013

Nanoparticle Harnesses Powerful Radiation Therapy for Cancer May 20th, 2013

Microneedle-Delivered Nanoparticles Boost Antitumor Vaccines May 20th, 2013

Tools

JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013

Penn engineers' nanoantennas improve infrared sensing May 20th, 2013

Kinks and curves at the nanoscale: New research shows 'perfect twin boundaries' are not so perfect May 20th, 2013

NanoInk, Inc. Assets To Be Sold May 18th, 2013

Events/Classes

Iran to Hold 1st Conference on Applications of Nanotechnology in Energy Industry May 21st, 2013

Elsevier Business Intelligence (EBI) to Host 'IN3 Medical Device 360 Boston,' June 24-26, 2013 May 20th, 2013

Interactive Printed Products – New Applications Enabled by Organic and Printed Electronics May 16th, 2013

VDMA: New “Photonics Industry Report 2013” presented May 14th, 2013