Home > News > Nanotech Needs Metrology to Achieve Full Potential
November 16th, 2007
Nanotech Needs Metrology to Achieve Full Potential
Abstract:
For nanotech to evolve from the laboratory and R&D arena, new ways must be devised to use traditional metrology platforms such as the SEM and atomic force microscopy (AFM), as well as new measurement technologies. This was the assessment of Darlene Solomon, CTO for Agilent Technologies (Santa Clara, Calif.), in her keynote presentation at the Nanocon International conference held in Santa Clara, Calif.
Quoting Rear Admiral Grace Murray Hopper's remark that "One accurate measurement is worth one thousand expert opinions," Solomon stated that since measurement is the cornerstone of scientific progress, it is therefore a primary driver in getting nanotech to reach its full potential. "As our ability to measure improves, we learn new things about how nature works. We then use what we learned to develop new technologies that, in turn, help us develop new measurements," she said.
Source:
semiconductor.net
Related News Press |
Announcements
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers/Posters
Researchers develop artificial building blocks of life March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
Events/Classes
Researchers demonstrate co-propagation of quantum and classical signals: Study shows that quantum encryption can be implemented in existing fiber networks January 20th, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||