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Home > News > Intel VP at ITC calls for test development advances to meet challenges of next-gen SoC

October 24th, 2007

Intel VP at ITC calls for test development advances to meet challenges of next-gen SoC

Abstract:
The International Test Conference here opened Oct. 23 with a plenary talk from Gadi Singer, vice president and assistant general manager of Intel Corp., on "Meeting the Challenges at the Extreme Ends of the Spectrum—Nanotechnology and Giga Complexity." He started out by noting that Mips per cubic foot, or Mips per pound, has been increasing by a factor of 100 every 10 years since 1940. Although the exponential changes have been on a smooth curve, there have been many discontinuities and inflection points over that time.

"Now, four diverse trends are extending the envelope in all directions," said Singer. First, IC complexity and diversity are being driven by the emergence of smart (portable) devices. These new designs include more complex cores, multiple processing engines, increased memories, specialized subsystems and multiple communications systems on the chip. In addition, Singer said that "the 'Internet effect' shows the effect of convergence of digital data into all functions, and requires an increase in hardware and software interactions."

Source:
eetimes.com

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