- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
In a study of contaminant levels for silicon wafers utilized in photovoltaic applications, new test levels for purity reveal irradiation tests as the most comprehensive. The white paper, posted on ElementalAnalysis.com, discusses how Neutron Activation Analysis (NAA) exhibit accuracies up to parts per quadrillion.
Elemental Analysis Inc. , a privately held trace element analysis firm, today released a study which defines expanded silicon purity testing levels with applications to photovoltaic cells. The rise of nanotechnology and solar energy demand, combined with tight polysilicon supplies, require increasing purity testing levels for production.
The study reveals that irradiation testing of polysilicon cells can insure detection of contaminants to levels as sensitive as one part per quadrillion. Samples do not undergo pre-test irradiation.
The study provides test parameter data to aid silicon producers in evaluating the extended test application for industry production. By catching contamination early, companies can potentially reduce waste and improve production outputs.
Testing can turn around in as little as three days, speeding the process up substantially from current market wait times as long as three months.
Semiconductor, solar cell producers and nanotechnology firms are pushing for the highest accuracy test levels to insure purity of their products as they hit the markets.
"We can provide trace element testing to parts per quadrillion using our Neutron Activation Analysis techniques," states Mark Stauffer, of Elemental Analysis. "This 'ultra trace detection' capability enables our customers to take their products to market with full confidence that the purity levels required for performance are there."
To obtain a copy of the study, entitled "Purity Testing for Photovoltaic Wafers", visit the site at http://www.elementalanalysis.com/study
About Elemental Analysis Inc.
Elemental Analysis, Inc. (EAI), a privately held company, provides all segments of industry with trace element analysis to determine product compositions and potential contamination levels. The company utilizes both non-destructive and state of the art forms of analytical chemistry with limits of detection ranging from sub-percent, to as low as parts-per-quadrillion.
For more information, please click here
mstauffer @ elementalanalysis.com
Copyright © PRWeb™If you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015
Visualizing How Radiation Bombardment Boosts Superconductivity: Atomic-level flyovers show how impact sites of high-energy ions pin potentially disruptive vortices to keep high-current superconductivity flowing May 23rd, 2015
Efficiency record for black silicon solar cells jumps to 22.1 percent: Aalto University's researchers improved their previous record by over 3 absolute percents in cooperation with Universitat Politècnica de Catalunya May 18th, 2015
ORNL demonstrates first large-scale graphene fabrication May 14th, 2015