Home > Press > X MET3000TXV+ - The new handheld XRF analyser for light metals analysis in the aerospace industry
|Oxford Instruments Hand-Held XRF Analyzer for Light Elements|
Oxford Instruments has launched a new, portable X-Ray Fluorescence (XRF) analyser with vacuum pump for the analysis of light metal alloys. The X MET3000TXV+ can now measure silicon and magnesium in aluminum and the aluminium in titanium alloys in airplane components that were previously not measurable with portable XRF instruments. With one pull of the trigger, the light weight X MET3000TXV+ delivers faster-than-ever results for rapid and accurate alloy identification as well as a detailed quantitative analysis of the sample composition.
X MET3000TXV+ - The new handheld XRF analyser for light metals analysis in the aerospace industry
UK | Posted on July 18th, 2007
This unit brings the most value to users in applications where Optical Emission Spectroscopy cannot be used because of the mark the technique leaves on the surface. X-MET3000TXV+'s light element capability is especially useful in the aerospace and related industries where aluminum and titanium alloys are widely used. With this system, there is no compressed gas bottle to carry, the cost of consumables is eliminated and inspection won't stop when the gas runs out.
With traditional portable XRF analysers, alloy identification has been based on the analysis of the heavy elements because magnesium, aluminum and silicon produce low energy x-rays that are impeded by air. The portable vacuum pump of the X MET3000TXV+ evacuates the analysis path of air, making the measurement of these elements possible.
The new vacuum feature is enhanced by the high resolution PentaPIN™ detector that delivers faster analysis and lower detection limits. It is configured primarily to identify aluminum and titanium alloys which are differentiated only by their concentration of silicon or magnesium. The X MET3000TXV+ can perform to the same high standard of the X MET3000TX+ analyzer on all other alloy types (stainless steel, copper alloys, etc.).
Inclusion of the new PentaPINTM detector - which is based on the Oxford Instruments' proven and patented PentaFET® technology - enables faster analysis and lower detection limits for all elements to be analyzed. Low detection limits are an irreplaceable feature due the exacting standards of the aerospace industry. With the PentaPINTM detector, a ten second analysis produces the equivalent of a thirty second analysis made using an instrument with a standard Si-PIN detector. New improved software has been implemented to process the data generated by the detector and increases the accuracy of the results obtained.
About Oxford Instruments
Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions with a focus on physical science, bioscience, environmental and industrial research and applications. It provides solutions needed to advance fundamental nanoscience research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 40 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University over forty years ago, Oxford Instruments is now a global company with over 1,300 staff worldwide and a listing on the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the Physical Science and Bioscience sectors.
This involves the combination of core technologies in areas such as low temperature and high magnetic field environments, Nuclear Magnetic Resonance, X-ray electron and optical based metrology, and advanced growth, deposition and etching. Our products, expertise, and ideas address global issues such as energy, environment, terrorism and health and are part of the next generation of telecommunications, energy products, environmental measures, security devices, drug discovery and medical advances.
For more information, please click here
945 Busse Road
Elk Grove Village, IL 60007
Marketing Communications Manager
Copyright © Oxford Instruments
If you have a comment, please Contact
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Less is More: Novel Cellulose Structure Requires Fewer Enzymes to Process Biomass to Fuel June 19th, 2013
Sound waves precisely position nanowires June 19th, 2013
Scientists Use Nanotechnology to Increase Thermal Stability of Essential Oils June 19th, 2013
Production of Bioactive Material for Quick Treatment of Bone Damages June 19th, 2013
Beating the Diffraction Limit by 1000X – An introduction to nanoscale IR imaging on Bruker AFMs with applications in graphene June 19th, 2013
Nanometrics Announces Participation in 5th Annual CEO Investor Summit: Accredited Investor and Publishing Research Analyst Event to be Held Concurrently With SEMICON West and Intersolar 2013 in San Francisco June 19th, 2013
Beneq’s comprehensive industrial Thin Film Coating Services shorten time to market June 18th, 2013
Which qubit my dear? New method to distinguish between neighbouring quantum bits June 18th, 2013