Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > X MET3000TXV+ - The new handheld XRF analyser for light metals analysis in the aerospace industry

Oxford Instruments Hand-Held XRF Analyzer for Light Elements
Oxford Instruments Hand-Held XRF Analyzer for Light Elements

Abstract:
Oxford Instruments has launched a new, portable X-Ray Fluorescence (XRF) analyser with vacuum pump for the analysis of light metal alloys. The X MET3000TXV+ can now measure silicon and magnesium in aluminum and the aluminium in titanium alloys in airplane components that were previously not measurable with portable XRF instruments. With one pull of the trigger, the light weight X MET3000TXV+ delivers faster-than-ever results for rapid and accurate alloy identification as well as a detailed quantitative analysis of the sample composition.

X MET3000TXV+ - The new handheld XRF analyser for light metals analysis in the aerospace industry

UK | Posted on July 18th, 2007

This unit brings the most value to users in applications where Optical Emission Spectroscopy cannot be used because of the mark the technique leaves on the surface. X-MET3000TXV+'s light element capability is especially useful in the aerospace and related industries where aluminum and titanium alloys are widely used. With this system, there is no compressed gas bottle to carry, the cost of consumables is eliminated and inspection won't stop when the gas runs out.

With traditional portable XRF analysers, alloy identification has been based on the analysis of the heavy elements because magnesium, aluminum and silicon produce low energy x-rays that are impeded by air. The portable vacuum pump of the X MET3000TXV+ evacuates the analysis path of air, making the measurement of these elements possible.

The new vacuum feature is enhanced by the high resolution PentaPIN™ detector that delivers faster analysis and lower detection limits. It is configured primarily to identify aluminum and titanium alloys which are differentiated only by their concentration of silicon or magnesium. The X MET3000TXV+ can perform to the same high standard of the X MET3000TX+ analyzer on all other alloy types (stainless steel, copper alloys, etc.).

Inclusion of the new PentaPINTM detector - which is based on the Oxford Instruments' proven and patented PentaFET® technology - enables faster analysis and lower detection limits for all elements to be analyzed. Low detection limits are an irreplaceable feature due the exacting standards of the aerospace industry. With the PentaPINTM detector, a ten second analysis produces the equivalent of a thirty second analysis made using an instrument with a standard Si-PIN detector. New improved software has been implemented to process the data generated by the detector and increases the accuracy of the results obtained.

####

About Oxford Instruments
Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions with a focus on physical science, bioscience, environmental and industrial research and applications. It provides solutions needed to advance fundamental nanoscience research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 40 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University over forty years ago, Oxford Instruments is now a global company with over 1,300 staff worldwide and a listing on the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the Physical Science and Bioscience sectors.

This involves the combination of core technologies in areas such as low temperature and high magnetic field environments, Nuclear Magnetic Resonance, X-ray electron and optical based metrology, and advanced growth, deposition and etching. Our products, expertise, and ideas address global issues such as energy, environment, terrorism and health and are part of the next generation of telecommunications, energy products, environmental measures, security devices, drug discovery and medical advances.

For more information, please click here

Contacts:
Oxford Instruments
945 Busse Road
Elk Grove Village, IL 60007
Stephanie Kowalyk
Marketing Communications Manager

Copyright © Oxford Instruments

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

NanoTechnology for Defense (NT4D) October 22nd, 2014

Mechanism behind nature's sparkles revealed October 22nd, 2014

TARA Biosystems and Harris & Harris Group Form Company to Improve Safety and Efficacy of New Therapies October 22nd, 2014

Researchers patent a nanofluid that improves heat conductivity October 22nd, 2014

Tools

NIST offers electronics industry 2 ways to snoop on self-organizing molecules October 22nd, 2014

Special UO microscope captures defects in nanotubes: University of Oregon chemists provide a detailed view of traps that disrupt energy flow, possibly pointing toward improved charge-carrying devices October 21st, 2014

Super stable garnet ceramics may be ideal for high-energy lithium batteries October 21st, 2014

Detecting Cancer Earlier is Goal of Rutgers-Developed Medical Imaging Technology: Rare earth nanocrystals and infrared light can reveal small cancerous tumors and cardiovascular lesions October 21st, 2014

NanoNews-Digest
The latest news from around the world, FREE





  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE