- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
May 7th, 2007
Using CharFlo-Memory! can prevent the reliability issues such as ‘glitch' and ‘meta-stability' due to incorrect setup and hold time modeling. Especially, the input of sense-amplifier in read cycle may be smaller than 'noise margin' (e.g. 100mv.), which will cause the false data outputs. This problem is normally due to the PVT variations and overdrive high frequency in low-power and high-speed designs. The CharFlo-Memory! can automatically validate the input of sense-amplifier against the noise margin to improve the design yields.
"Quality of embedded memory models is essential for the silicon success of deep-submicron and nanometer SoC designs," said Dr. You-Pang Wei, president and chief executive officer of Legend Design Technology. "With the adoption of Legend's Charflo-Memory!, Dongbu HiTek has acquired the premier solution for memory re-characterization and verification at any PVT. We're pleased to be working closely with Dongbu HiTek in meeting their needs for state-of-the-art SoC designs."
|Related News Press|
Nanometrics Reports Second Quarter 2016 Financial Results July 26th, 2016
Research team led by NUS scientists develop plastic flexible magnetic memory device: Novel technique to implant high-performance magnetic memory chip on a flexible plastic surface without compromising performance July 21st, 2016
Smallest hard disk to date writes information atom by atom July 20th, 2016
Pixel-array quantum cascade detector paves the way for portable thermal imaging devices: Research team from TU-Wien Center for Micro- and Nanostructures have developed a new 'cooler' sensing instrument thereby increasing energy-efficiency and enhancing mobility for diagnostic tes July 28th, 2016
Thomas Swan and NGI announce unique partnership July 28th, 2016