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Home > News > Metrology for nanotechnology

April 2nd, 2007

Metrology for nanotechnology

Abstract:
A workshop on metrology for nanotechnology will take place on 14 and 15 June in Turin, Italy.

The event will be application-oriented, and will incorporate real industrial experiences and needs. It will bring together industrial users and experts from Italy's metrology community, as well as some international experts, to discuss needs in nanometrology and recent developments, particularly with reference to techniques and methods of measurement, instrumentation and standards.

Source:
cordis.europa.eu

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