Home > News > X-Tek announces new features for the Revolution X-ray inspection system
February 21st, 2007
X-Tek announces new features for the Revolution X-ray inspection system
The X-Tek Group has announced the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability.
Impix, the new scientific grade camera and detector combination, boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing. The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components. Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies. The Impix camera will also enhance the C.T. option on the Revolution by further improving the voxel resolution capability.
Harris & Harris Group to Host Conference Call on Second-Quarter 2014 Financial Results on August 15, 2014 July 23rd, 2014
UCF Nanotech Spinout Developing Revolutionary Battery Technology: Power the Next Generation of Electronics with Carbon July 23rd, 2014
Deadline Announced for Registration in 7th Int'l Nanotechnology Festival in Iran July 23rd, 2014
A Crystal Wedding in the Nanocosmos July 23rd, 2014
EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014
The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014
Nanometrics Announces Upcoming Investor Events July 22nd, 2014
Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014