Home > News > X-Tek announces new features for the Revolution X-ray inspection system
February 21st, 2007
X-Tek announces new features for the Revolution X-ray inspection system
The X-Tek Group has announced the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability.
Impix, the new scientific grade camera and detector combination, boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing. The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components. Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies. The Impix camera will also enhance the C.T. option on the Revolution by further improving the voxel resolution capability.
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