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Home > News > Inspection system for computerised tomography

February 5th, 2007

Inspection system for computerised tomography

Abstract:
The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, Booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of computerised tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system. Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution.

Source:
electronicstalk.com

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