Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > High-performance Fluorescent X-ray Film Thickness Meter

May 14th, 2006

High-performance Fluorescent X-ray Film Thickness Meter

Abstract:
SII NanoTechnology has launched SFT9500, an advanced fluorescent x-ray film thickness-measuring device.

Source:
japancorp.net

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Democratizing synthetic biology: New method makes research cheaper, faster, and more accessible March 3rd, 2015

Pens filled with high-tech inks for do-it-yourself sensors March 3rd, 2015

Black phosphorus is new 'wonder material' for improving optical communication March 3rd, 2015

Heightened Efficiency in Purification of Wastewater Using Nanomembranes March 3rd, 2015

Tools

Forbidden quantum leaps possible with high-res spectroscopy March 2nd, 2015

International research partnership tricks the light fantastic March 2nd, 2015

Important step towards quantum computing: Metals at atomic scale March 2nd, 2015

Mass spectrometers with optimised hydrogen pumping March 1st, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE