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Home > News > Powerful New Semiconductor Defect Analysis Solution

December 13th, 2005

Powerful New Semiconductor Defect Analysis Solution

Abstract:
FEI Company (Nasdaq: FEIC), the industry leader in Tools for Nanotech(TM), and PDF Solutions, Inc., the leading provider of semiconductor process-design integration technologies and services, jointly announced the successful integration of PDF Solutions Characterization Vehicle(R) (CV) infrastructure (CVi) and FEI's Defect Analyzer (DA) 300HP next-generation DualBeam(TM) system for automated in-fab defect analysis.

Source:
prnewswire

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